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Journal of Microscopy|June 10, 2010
Image analysis benchmarking methods for high-content screen designC J Fuller, A F StraightJournal of Microscopy|June 10, 2010
Automatic identification of Caenorhabditis elegans in population images by shape energy featuresD Ochoa, S Gautama, W PhilipsJournal of Microscopy|July 16, 2010
Characterization of dilute species within CVD-grown silicon nanowires doped using trimethylboron: protected lift-out specimen preparation for atom probe tomographyT J Prosa, R Alvis, L Tsakalakos, et al.Journal of Microscopy|July 16, 2010
Photo- and bio-physical characterization of novel violet and near-infrared lipophilic fluorophores for neuronal tracingJ Tonniges, M Hansen, J Duncan, et al.Journal of Microscopy|July 16, 2010
Using a zone axis for convergent beam electron diffraction measurements of lattice strain in strained siliconD R Diercks, M J Kaufman, R B Irwin, et al.Journal of Microscopy|July 16, 2010
Texture classification by statistical learning from morphological image processing: application to metallic surfacesA Cord, F Bach, D JeulinJournal of Microscopy|June 29, 2010
Four-dimensional telomere analysis in recordings of living human cells acquired with controlled light exposure microscopyW H De Vos, G H Joss, W Haffmans, et al.Journal of Microscopy|June 29, 2010
Segmentation of 3D microtomographic images of granular materials with the stochastic watershedM Faessel, D JeulinJournal of Microscopy|June 29, 2010
Principles of depth-resolved Kikuchi pattern simulation for electron backscatter diffractionA WinkelmannJournal of Microscopy|August 13, 2010
Microstructural characterization of laser surface melted AISI M2 tool steelJ Arias, M Cabeza, G Castro, et al.Pageof 486