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Journal of Microscopy|December 2, 2010
Minimizing light exposure with the programmable array microscopeW Caarls, B Rieger, A H B De Vries, et al.Journal of Microscopy|December 2, 2010
New method for characterizing paper coating structures using argon ion beam milling and field emission scanning electron microscopyC Dahlström, R Allem, T UesakaJournal of Microscopy|December 2, 2010
Enhancing collection efficiency in large field of view multiphoton microscopyJ D McMullen, A C Kwan, R M Williams, et al.Journal of Microscopy|December 2, 2010
Comparison of convergent beam electron diffraction and geometric phase analysis for strain measurement in a strained silicon deviceD Diercks, G Lian, J Chung, et al.Journal of Microscopy|December 2, 2010
Correlative microscopy of detergent granulesG van Dalen, P Nootenboom, P C M HeussenJournal of Microscopy|December 2, 2010
Imaging via widefield surface plasmon resonance microscope for studying bone cell interactions with micropatterned ECM proteinsF Sefat, M C T Denyer, M YouseffiJournal of Microscopy|December 2, 2010
Focussed ion beam nanotomography reveals the 3D morphology of different solid phases in hardened cement pastesP Trtik, B Münch, P Gasser, et al.Journal of Microscopy|December 2, 2010
FRET microscopy: from principle to routine technology in cell biologyA Pietraszewska-Bogiel, T W J GadellaJournal of Microscopy|December 2, 2010
The effects of spherical aberration on multiphoton fluorescence excitation microscopyP A Young, S G Clendenon, J M Byars, et al.Journal of Microscopy|December 2, 2010
A brief introduction to computer-intensive methods, with a view towards applications in spatial statistics and stereologyTorsten MattfeldtPageof 486