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Journal of Microscopy|January 1, 1985
Weighted least squares estimation of background in EELS imagingT Pun, J R Ellis, M EdenJournal of Microscopy|March 10, 2001
High resolution protein localization using soft X-ray microscopyW Meyer-Ilse, D Hamamoto, A Nair, et al.Journal of Microscopy|April 13, 1999
Ultrastructural characterization of isolated rat Kupffer cells by transmission X-ray microscopyJ G Scharf, G SchneiderJournal of Microscopy|June 6, 2003
Magneto-optical near-field microscopy of ultrathin films in ultrahigh vacuumG Meyer, T Crevelius, A Bauer, et al.Journal of Microscopy|June 6, 2003
Transient optical elements: application to near-field microscopyD Simanovskii, D Palanker, K Cohn, et al.Journal of Microscopy|November 4, 2016
Atomic resolution imaging of beryl: an investigation of the nano-channel occupationV Arivazhagan, F D Schmitz, P E Vullum, et al.Journal of Microscopy|January 10, 2017
Effect of prior deformation on microstructural development and Laves phase precipitation in high-chromium stainless steelZ-W Hsiao, D Chen, J-C Kuo, et al.Journal of Microscopy|December 2, 2016
Evolution of defects in titanium grade 2 under Ti2+ ion irradiationE Jouanny, S Doriot, J Malaplate, et al.Journal of Microscopy|April 23, 2014
Photothermal microscopy: optical detection of small absorbers in scattering environmentsPierre Vermeulen, Laurent Cognet, Brahim LounisPageof 486