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Journal of Microscopy|June 29, 2010
Three-dimensional analysis of intermediate filament networks using SEM tomographyS Lück, M Sailer, V Schmidt, et al.
Journal of Microscopy|June 29, 2010
Formation and reduction of streak artefacts in electron tomographyM Cao, H-B Zhang, Y Lu, et al.
Journal of Microscopy|August 13, 2010
Enhanced angular current intensity from Schottky emittersS Fujita, T R C Wells, W Ushio, et al.
Journal of Microscopy|February 18, 2009
Application of environmental scanning electron microscopy to determine biological surface structureS E Kirk, J N Skepper, A M Donald
Journal of Microscopy|February 18, 2009
An atomic force microscope operating at hypergravity for in situ measurement of cellular mechano-responseJ J W A van Loon, M C van Laar, J P Korterik, et al.
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