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Journal of Microscopy|May 26, 2004
Circuit editing of copper and low-k dielectrics in nanotechnology devicesF Mosselveld, V V Makarov, T R Lundquist, et al.Journal of Microscopy|May 26, 2004
Thermal stability of Ti and Pt nanowires manufactured by Ga+ focused ion beamB J Inkson, G Dehm, T WagnerJournal of Microscopy|May 26, 2004
Quantitative optical microscope with enhanced resolution using a pixelated liquid crystal spatial light modulatorA Y M Ng, C W See, M G SomekhJournal of Microscopy|March 11, 2004
Progressive steps in the development of electron backscatter diffraction and orientation imaging microscopyD DingleyJournal of Microscopy|March 11, 2004
Reconstruction of grains and subgrains from electron backscatter diffraction mapsF J HumphreysJournal of Microscopy|March 11, 2004
EBSD and TEM investigation of the hot deformation substructure characteristics of a type 316L austenitic stainless steelP Cizek, J A Whiteman, W M Rainforth, et al.Journal of Microscopy|March 11, 2004
EBSD characterization of carbide-carbide boundaries in WC-Co compositesM U Farooq, U KlementJournal of Microscopy|January 21, 2004
Confocal laser scanning microscopy - an attractive tool for studying the uptake of xenobiotics into plant foliageZ LiuJournal of Microscopy|January 21, 2004
Analysis of networks based on styrene and divinylbenzene containing iron anchored using variable pressure scanning electron microscopyL C de Santa Maria, M C A M Leite, M A S Costa, et al.Journal of Microscopy|January 21, 2004
Laser scanning confocal microscopy for in situ monitoring of alkali-silica reactionC L Collins, J H Ideker, K E KurtisPageof 486