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Journal of Microscopy|November 1, 1976
A standard field area frame for use in automatic image analysisR L Alston, L StanbridgeJournal of Microscopy|May 29, 1999
The efficiency of systematic sampling in stereology--reconsideredH J Gundersen, E B Jensen, K Kiêu, et al.Journal of Microscopy|August 25, 1999
Stereological estimation of covariance using linear dipole probesM G Reed, C V HowardJournal of Microscopy|August 25, 1999
Effect of anticoagulation and lavage prior to casting of postmortem material with Mercox and Batson 17R Martín-Orti, M Stefanov, I Gaspar, et al.Journal of Microscopy|August 25, 1999
A comparison of grain imaging and measurement using horizontal orientation and colour orientation contrast imaging, electron backscatter pattern and optical methodsDay, QuestedJournal of Microscopy|August 25, 1999
Crystallographic analysis of facets using electron backscatter diffractionRandleJournal of Microscopy|August 25, 1999
Electron backscatter diffraction: applications for nuclear materialsMedevielle, Hugon, DugneJournal of Microscopy|November 30, 1999
A procedure to prepare cultured cells in suspension for electron probe X-ray microanalysis: application to scanning and transmission electron microscopyE Fernández-Segura, F J Cañizares, M A Cubero, et al.Journal of Microscopy|December 14, 1999
Signal components in the environmental scanning electron microscopeFletcher, Thiel, DonaldJournal of Microscopy|November 30, 1999
Cryo-techniques applied to stratum corneum with description of a new sample holder for cryo-scanning electron microscopy of freeze-fractured samplesP Hallegot, A M Minondo, F FiatPageof 486