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Journal of Microscopy|May 20, 2003
Atomic vacancy-induced friction on the graphite surface: observation by lateral force microscopyJ I Paredes, A Martínez-Alonso, J M D TascónJournal of Microscopy|May 20, 2003
Retention of fluorescent probes during aldehyde-free anhydrous freeze-substitutionG J Hyde, D S Davies, L Cole, et al.Journal of Microscopy|May 20, 2003
A comparative study of the quantitative accuracy of three-dimensional reconstructions of spinal cord from serial histological sectionsB S Duerstock, C L Bajaj, R B BorgensJournal of Microscopy|May 20, 2003
Measurement of the laser pulse width on the microscope objective plane by modulated autocorrelation methodF Cannone, G Chirico, G Baldini, et al.Journal of Microscopy|May 20, 2003
SiCf-SiBC composites: microstructural investigations of the as-received material and creep tested composites under an oxidative environmentG Farizy, J-L Chermant, J C Sangleboeuf, et al.Journal of Microscopy|December 1, 1975
A container for handling small specimens during preparation and examination in the scanning electron microscope (SEM)P G TaylorJournal of Microscopy|December 4, 2002
Nonlinear bio-photonic crystal effects revealed with multimodal nonlinear microscopyS-W Chu, I-H Chen, T-M Liu, et al.Journal of Microscopy|December 4, 2002
Software techniques for EELS to realize about 0.3 eV energy resolution using 300 kV FEG-TEMK Kimoto, Y MatsuiJournal of Microscopy|June 6, 2003
Probing highly confined optical fields in the focal region of a high NA parabolic mirror with subwavelength spatial resolutionC Debus, M A Lieb, A Drechsler, et al.Journal of Microscopy|June 6, 2003
Study of the focused laser spots generated by various polarized laser beam conditionsY H Fu, F H Ho, W C Lin, et al.Pageof 486