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Journal of Microscopy|June 5, 2001
The depolarization near-field scanning optical microscope: comparison of experiment and theoryG von Freymann, C Adelmann, G Scheiber, et al.Journal of Microscopy|June 5, 2001
Mid-infrared scanning near-field optical microscope resolves 30 nmB Knoll, F KeilmannJournal of Microscopy|June 5, 2001
Interferometric measurement of femtosecond optical pulses emitted from a fibre probeH Kawashima, M Furuki, T TaniJournal of Microscopy|June 5, 2001
Near-field optical microscopy of localized excitations on rough surfaces: influence of a probeS I BozhevolnyiJournal of Microscopy|April 12, 2001
Silicon technology-based micro-systems for atomic force microscopy/photon scanning tunnelling microscopyP Gall-Borrut, B Belier, P Falgayrettes, et al.Journal of Microscopy|April 12, 2001
Shaping the reflection near-field optical probe: finite domain time difference modelling and fabrication using a focused ion beamM Spajer, G Parent, C Bainier, et al.Journal of Microscopy|April 12, 2001
Local phase measurements of light in a one-dimensional photonic crystalE Flück, A M Otter, J P Korterik, et al.Journal of Microscopy|April 12, 2001
The correlation between polarization modulated near-field optical images and the anisotropy of the probeP K Wei, W S FannJournal of Microscopy|April 12, 2001
Non-optical tip-sample distance control method for scanning near-field optical microscopy using a piezoresistive micro cantileverH Muramatsu, A Egawa, K Homma, et al.Journal of Microscopy|April 12, 2001
Separating different contributions to the shear force in near-field microscopyM Leuschner, M Schüttler, H GiessenPageof 482