Related Experiment Video

Updated: Oct 8, 2026

All-electronic Nanosecond-resolved Scanning Tunneling Microscopy: Facilitating the Investigation of Single Dopant Charge Dynamics
11:33

All-electronic Nanosecond-resolved Scanning Tunneling Microscopy: Facilitating the Investigation of Single Dopant Charge Dynamics

Published on: January 19, 2018

Silicon technology-based micro-systems for atomic force microscopy/photon scanning tunnelling microscopy

P Gall-Borrut1, B Belier, P Falgayrettes

  • 1CEM2, Université Montpellier II, 34095 Montpellier Cedex 5, France. gall@cem2.univ-montp2.fr

Journal of Microscopy
|April 12, 2001
PubMed

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