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Journal of Research of the National Institute of Standards and Technology|July 23, 2016
Optical Diffraction in Close Proximity to Plane Apertures. I. Boundary-Value Solutions for Circular Apertures and SlitsKlaus D Mielenz
Journal of Research of the National Institute of Standards and Technology|July 23, 2016
Conventional Cells-The Last Step Toward General Acceptance of Standard Conventional Cells for the Reporting of Crystallographic DataAlan D Mighell
Journal of Research of the National Institute of Standards and Technology|July 23, 2016
Noise-Parameter Uncertainties: A Monte Carlo SimulationJ Randa
Journal of Research of the National Institute of Standards and Technology|July 23, 2016
Transient Green's Tensor for a Layered Solid Half-Space With Different Interface ConditionsShu-Chu Ren, Nelson N Hsu, Donald G Eitzen
Journal of Research of the National Institute of Standards and Technology|July 23, 2016
Decomposition of Wavelength Dispersive X-Ray SpectraGuy Rémond, Robert Myklebust, Michel Fialin, et al.
Journal of Research of the National Institute of Standards and Technology|July 23, 2016
The Microcalorimeter for Industrial ApplicationsDel Redfern, Joe Nicolosi, Jens Höhne, et al.
Journal of Research of the National Institute of Standards and Technology|July 23, 2016
Characterization of Corning EPMA Standard Glasses 95IRV, 95IRW, and 95IRXPaul Carpenter, Dale Counce, Emily Kluk, et al.
Journal of Research of the National Institute of Standards and Technology|July 23, 2016
Microbeam Characterization of Corning Archeological Reference Glasses: New Additions to the Smithsonian Microbeam Standard CollectionEdward P Vicenzi, Stephen Eggins, Amelia Logan, et al.
Journal of Research of the National Institute of Standards and Technology|January 1, 1996
Optimally Toothed Apertures for Reduced DiffractionEric L Shirley, R U Datla
Journal of Research of the National Institute of Standards and Technology|January 1, 1996
Bombardment Induced Electron-Capture Processes at Sodium Halide SurfacesJoseph Fine, M Szymonski, J Kolodziej, et al.
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