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Journal of Research of the National Institute of Standards and Technology|August 9, 2016
QuasicrystalsJ W CahnJournal of Research of the National Institute of Standards and Technology|August 9, 2016
Standard Reference Material (SRM 1990) For Single Crystal Diffractometer AlignmentW Wong-Ng, T Siegrist, G T DeTitta, et al.Journal of Research of the National Institute of Standards and Technology|July 23, 2016
Averaging of Backscatter Intensities in CompoundsJohn J Donovan, Nicholas E Pingitore, Andrew J WestphalJournal of Research of the National Institute of Standards and Technology|July 23, 2016
Sample Preparation for Electron Probe Microanalysis-Pushing the LimitsJoseph D Geller, Paul D EngleJournal of Research of the National Institute of Standards and Technology|July 23, 2016
Copper Oxide Precipitates in NBS Standard Reference Material 482Eric S Windsor, Robert A Carlton, Greg Gillen, et al.Journal of Research of the National Institute of Standards and Technology|July 23, 2016
Smithsonian Microbeam StandardsEugene JarosewichJournal of Research of the National Institute of Standards and Technology|July 5, 2023
The Measurement of Averages and Extremes of Environmental VariablesC W Anderson, K F TurkmanJournal of Research of the National Institute of Standards and Technology|July 5, 2023
Identification of Failure Origin Through Testing and the Weibull Risk-of-RuptureJohn A Tesk, Martin Y M Chiang, Spurgeon M Keeny, et al.Journal of Research of the National Institute of Standards and Technology|July 5, 2023
On the Requirements for a Reasonable Extreme Value Prediction of Maximum Pits on Hot-Water-Supply Copper TubingShigeru Komukai, Komei KasaharaJournal of Research of the National Institute of Standards and Technology|July 5, 2023
Erratum: Precision Comparison of the Lattice Parameters of Silicon MonocrystalsE G Kessler, A Henins, R D Deslattes, et al.Pageof 111