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Journal of Synchrotron Radiation|August 6, 2024
In situ characterization of stresses, deformation and fracture of thin films using transmission X-ray nanodiffraction microscopy. CorrigendumGudrun Lotze, Anand H S Iyer, Olof Bäcke, et al.Journal of Synchrotron Radiation|August 16, 2024
Electrochemical cell for synchrotron nuclear resonance techniquesSergey Yaroslavtsev, Jean Philippe CelseJournal of Synchrotron Radiation|July 29, 2024
Double-edge scan wavefront metrology and its application in crystal diffraction wavefront measurementsFang Liu, Ming Li, Qianshun Diao, et al.Journal of Synchrotron Radiation|June 25, 2024
Welcoming a new Main Editor of Journal of Synchrotron RadiationAndrew J Allen, Dibyendu Bhattacharyya, Kristina KvashninaJournal of Synchrotron Radiation|June 25, 2024
X-ray scattering based scanning tomography for imaging and structural characterization of cellulose in plantsLin YangJournal of Synchrotron Radiation|June 25, 2024
Nonlinear optimization for a low-emittance storage ringBonghoon Oh, Jinjoo Ko, Seunghwan Shin, et al.Journal of Synchrotron Radiation|July 23, 2024
VUV absorption spectra of water and nitrous oxide by a double-duty differentially pumped gas filterAndras Bodi, Jonas Knurr, Patrick Ascher, et al.Journal of Synchrotron Radiation|June 20, 2024
Asymmetric electrostatic dodecapole: compact bandpass filter with low aberrations for momentum microscopyO Tkach, S Chernov, S Babenkov, et al.Journal of Synchrotron Radiation|November 6, 2023
Beagle: a near-edge X-ray absorption fine-structure spectroscopy data processing solution for beamline experiments at Pohang Accelerator LaboratoryJae Yeon Park, Minwoong Lee, Seong Hoon Jeong, et al.Journal of Synchrotron Radiation|August 23, 2023
Inversion model for extracting chemically resolved depth profiles across liquid interfaces of various configurations from XPS data: PROPHESYMatthew Ozon, Konstantin Tumashevich, Jack J Lin, et al.Pageof 458