Related Experiment Video
Updated: Jul 18, 2025

Determining the Chemical Composition of Corrosion Inhibitor/Metal Interfaces with XPS: Minimizing Post Immersion Oxidation
Published on: March 15, 2017
Inversion model for extracting chemically resolved depth profiles across liquid interfaces of various configurations
Matthew Ozon1, Konstantin Tumashevich1, Jack J Lin1
1Center for Atmospheric Research, University of Oulu, PO Box 4500, Finland.
Abstract:
PROPHESY, a technique for the reconstruction of surface-depth profiles from X-ray photoelectron spectroscopy data, is introduced. The inversion methodology is based on a Bayesian framework and primal-dual convex optimization. The acquisition model is developed for several geometries representing different sample types: plane (bulk sample), cylinder (liquid microjet) and sphere (droplet). The methodology is tested and characterized with respect to simulated data as a proof of concept. Possible limitations of the method due to uncertainty in the attenuation length of the photo-emitted electron are illustrated.
Related Concept Videos
Inductively Coupled Plasma–Mass Spectrometry (ICP–MS): Overview
Interfacial Electrochemical Methods: Overview

