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Journal of Synchrotron Radiation|February 28, 2003
Scanning X-ray microdiffraction with submicrometer white beam for strain/stress and orientation mapping in thin filmsN Tamura, A A MacDowell, R Spolenak, et al.Journal of Synchrotron Radiation|February 28, 2003
Absorption and extinction correction in quantitative DAFS analysisDirk C Meyer, Andreas Kupsch, Peter PauflerJournal of Synchrotron Radiation|February 28, 2003
Dynamics of phase transformations and microstructure evolution in carbon-manganese steel arc welds using time-resolved synchrotron X-ray diffractionJoe Wong, Thorsten Ressler, John W ElmerJournal of Synchrotron Radiation|February 28, 2003
Software for automatic calibration of synchrotron powder diffractometersDavid Laundy, Chiu Tang, Mark Roberts, et al.Journal of Synchrotron Radiation|February 28, 2003
Miniature ionization chamber detector developed for X-ray microprobe measurementsM Kocsis, A SomogyiJournal of Synchrotron Radiation|February 28, 2003
SAXSANA: an interactive program for the analysis and monitoring of static and time-resolved small-angle X-ray solution scattering measurementsYuzuru Hiragi, Yoh Sano, Tomoharu MatsumotoJournal of Synchrotron Radiation|August 29, 2003
Advantage of the Mark-III FEL for biophysical research and biomedical applicationsGlenn S Edwards, M Shane HutsonJournal of Synchrotron Radiation|August 29, 2003
Short-period multilayer X-ray mirrorsS S Andreev, M S Bibishkin, N I Chkhalo, et al.Journal of Synchrotron Radiation|August 29, 2003
Correlation of the local and the macroscopic properties of high-temperature superconductors: EXAFS data analysisAlexey MenushenkovJournal of Synchrotron Radiation|August 29, 2003
Point-defect-induced forbidden reflections in resonant X-ray scatteringVladimir E Dmitrienko, Elena N OvchinnikovaPageof 458