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Journal of Synchrotron Radiation|October 25, 2014
Full-field X-ray reflection microscopy of epitaxial thin-filmsNouamane Laanait, Zhan Zhang, Christian M Schlepütz, et al.Journal of Synchrotron Radiation|October 25, 2014
Characteristics of a tapered undulator for the X-ray absorption fine-structure technique at PLS-IINark-Eon Sung, Ik-Jae Lee, Sung-hoon Jeong, et al.Journal of Synchrotron Radiation|October 25, 2014
Radiation dose and image quality in K-edge subtraction computed tomography of lung in vivoS Strengell, J Keyriläinen, P Suortti, et al.Journal of Synchrotron Radiation|October 25, 2014
Double-focusing mixing jet for XFEL study of chemical kineticsDingjie Wang, Uwe Weierstall, Lois Pollack, et al.Journal of Synchrotron Radiation|October 25, 2014
A high-precision instrument for mapping of rotational errors in rotary stagesWeihe Xu, Kenneth Lauer, Yong Chu, et al.Journal of Synchrotron Radiation|December 25, 2014
Inelastic X-ray scattering with 0.75 meV resolution at 25.7 keV using a temperature-gradient analyzerDaisuke Ishikawa, David S Ellis, Hiroshi Uchiyama, et al.Journal of Synchrotron Radiation|December 25, 2014
Characterization of a next-generation piezo bimorph X-ray mirror for synchrotron beamlinesSimon G Alcock, Ioana Nistea, John P Sutter, et al.Journal of Synchrotron Radiation|December 25, 2014
Polytypism in GaAs nanowires: determination of the interplanar spacing of wurtzite GaAs by X-ray diffractionMartin Köhl, Philipp Schroth, Andrey A Minkevich, et al.Journal of Synchrotron Radiation|December 25, 2014
Monitoring the thin film formation during sputter deposition of vanadium carbideMarthe Kaufholz, Bärbel Krause, Sunil Kotapati, et al.Pageof 458