Related Experiment Video
Updated: Apr 19, 2026
08:53
Angle-resolved Photoemission Spectroscopy At Ultra-low Temperatures
Published on: October 9, 2012
18.4K
Inelastic X-ray scattering with 0.75 meV resolution at 25.7 keV using a temperature-gradient analyzer
Daisuke Ishikawa1, David S Ellis1, Hiroshi Uchiyama1
1Materials Dynamics Laboratory, RIKEN SPring-8 Center, 1-1-1 Kouto, Sayo, Hyogo 679-5148, Japan.
Journal of Synchrotron Radiation
|December 25, 2014
Summary
Temperature-gradient analyzers improve energy resolution in high-resolution inelastic X-ray scattering (HRIXS). This method compensates for geometrical broadening, enabling precise measurements with advanced X-ray analysis.
Area of Science:
- Physics
- Materials Science
- Spectroscopy
Background:
- High-resolution inelastic X-ray scattering (HRIXS) requires exceptional energy resolution.
- Geometrical broadening often limits the achievable resolution in HRIXS experiments.
- Existing analyzer designs face trade-offs between resolution, acceptance, and experimental geometry.
Purpose of the Study:
- To investigate the efficacy of temperature-gradient analyzers for HRIXS.
- To demonstrate compensation for geometrical broadening using controlled temperature gradients.
- To achieve high energy resolution while maintaining practical experimental parameters.
Main Methods:
- Utilizing a temperature gradient of approximately 12 mK across a 9.5 cm analyzer crystal.
- Adjusting the lattice spacing of the analyzer crystal via the temperature gradient.
- Employing Si(13 13 13) and Si(11 11 11) crystals for X-ray analysis.
Main Results:
- Achieved an energy resolution of 0.75(2) meV FWHM at 25.7 keV using Si(13 13 13).
- Measured an energy resolution of 1.25(2) meV at 21.7 keV using Si(11 11 11).
- Maintained a large sample-detector clearance (250 mm) and reasonable analyzer acceptance (9.3 mrad × 8.8 mrad).
Conclusions:
- Temperature-gradient analyzers are effective for enhancing energy resolution in HRIXS.
- This technique overcomes limitations imposed by geometrical broadening.
- The method offers a promising approach for advanced X-ray scattering studies.
More Related Videos
Related Concept Videos
01:07Scanning Electron Microscopy
6.1K
A scanning electron microscope (SEM) is used to study the surface features of a sample by using an electron beam that scans the sample surface in a two-dimensional manner. Typically, areas between ~1 centimeter to 5 micrometers in width can be imaged. SEM can be used to image bacteria, viruses, tissues as well as larger samples like insects. Conventional SEM gives a magnification ranging from 20X to 30,000X and spatial resolution of 50 to 100 nanometers.
Fundamental Principles
Accelerated...
Fundamental Principles
Accelerated...
6.1K
01:29Atomic Emission Spectroscopy: Lab
851
AES is a powerful analytical technique, especially effective when used with plasma sources, producing abundant spectra in characteristic emission lines. The Inductively Coupled Plasma (ICP), in particular, yields superior quantitative analytical data due to its high stability, low noise, low background, and minimal interferences under optimal experimental conditions. However, newer air-operated microwave sources are emerging as promising alternatives that could be more cost-effective than...
851