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Microscopy (Oxford, England)|March 24, 2023
Development and applications of ultrafast transmission electron microscopyT Shimojima, A Nakamura, K IshizakaMicroscopy (Oxford, England)|July 2, 2026
Vogel spiral-based tilt-scan averaging approach for robust and efficient diffraction contrast suppression in DPC STEMAyumu Oyaizu, Satoko Toyama, Takehito Seki, et al.Microscopy (Oxford, England)|November 1, 2014
Recent improvement of a FIB-SEM serial-sectioning method for precise 3D image reconstruction - application of the orthogonally-arranged FIB-SEMToru HaraMicroscopy (Oxford, England)|November 1, 2014
Observations of crack propagation along a Zr-doped alumina grain boundaryA Ishihara, S Kondo, E Tochigi, et al.Microscopy (Oxford, England)|October 10, 2017
Three-dimensional observations of morphology of low-angle boundaries in ultra-low carbon lath martensiteShigekazu Morito, Anh Hoang Pham, Takuya Ohba, et al.Microscopy (Oxford, England)|September 9, 2026
Critical Excitation Energy-Based Method for Chemical Bonding State Analysis Using SEM-EDSYasuhiro Takatani, Noritake Isomura, Satoru Kosaka, et al.Microscopy (Oxford, England)|October 12, 2020
Phase-shifting electron holography for accurate measurement of potential distributions in organic and inorganic semiconductorsKazuo Yamamoto, Satoshi Anada, Takeshi Sato, et al.Microscopy (Oxford, England)|October 16, 2020
Photobleaching reduction in modulated super-resolution microscopyJafar H Ghithan, Jennifer M Noel, Thomas J Roussel, et al.Microscopy (Oxford, England)|July 15, 2021
Evolution in X-ray analysis from micro to atomic scales in aberration-corrected scanning transmission electron microscopesM Watanabe, R F EgertonMicroscopy (Oxford, England)|May 28, 2021
Development of a gas environmental heating specimen holder system using differential pumpingAyako Hashimoto, Yutain Han, Hajime Akimoto, et al.Pageof 82