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Microscopy (Oxford, England)|February 16, 2026
Exploring electronic, optical, and vibrational properties of low-dimensional materials employing monochromated EELSRyosuke SengaMicroscopy (Oxford, England)|February 17, 2026
Development of dodecahedron type MCP detector for SEM toward full energy range and solid angle electron detectionYuto Yanagihara, Yuanzhao Yao, Kazuhiro Kumagai, et al.Microscopy (Oxford, England)|February 16, 2026
Probing the Effective Mass and Fermi Velocity of Charges by Momentum-Resolved Electron Energy Loss SpectroscopyChih-Ying Huang, Somboon Fongchaiya, Chen-Yu Hung, et al.Microscopy (Oxford, England)|February 13, 2026
Non-Destructive Pre- and Post-Experimental Validation of Glass Nanopipette Geometry: Quantifying Beam-Induced Deformation in Membrane-Free TEMHan Gia Nguyen, Linhao Sun, Hirotoshi Furusho, et al.Microscopy (Oxford, England)|January 17, 2026
Angle-resolved Cathodoluminescence Microscopy on Plasmonic CrystalsHikaru Saito, Takumi SannomiyaMicroscopy (Oxford, England)|December 11, 2012
Cross-sectional transmission electron microscopy observation of sub-nano-sized molybdenum carbide crystals in carbon nanotubesRyusuke Sagawa, Kosuke Kurushima, Yuji Otsuka, et al.Microscopy (Oxford, England)|December 11, 2012
Transmission electron microscope as an ultimate tool for nanomaterial property studiesNaoyuki Kawamoto, Dai-Ming Tang, Xianlong Wei, et al.Microscopy (Oxford, England)|January 26, 2013
Sample heating system for spin-polarized scanning electron microscopyTeruo Kohashi, Kumi MotaiMicroscopy (Oxford, England)|January 8, 2013
Confessions of an icosahedral virus crystallographerJohn E JohnsonMicroscopy (Oxford, England)|January 22, 2013
Monochromated STEM with a 30 meV-wide, atom-sized electron probeOndrej L Krivanek, Tracy C Lovejoy, Niklas Dellby, et al.Pageof 82