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Microscopy (Oxford, England)|January 12, 2018
Crystal structures of high-pressure phases formed in Si by laser irradiationHiroyuki Iwata, Daisuke Kawaguchi, Hiroyasu SakaMicroscopy (Oxford, England)|July 24, 2021
In situ observation of the chemical bonding state of Si in the molten state of eutectic Au-Si alloy of Au81Si19 by using a soft X-ray emission spectroscopy electron microscopeMasami Terauchi, Naoya Umemoto, Yohei K Sato, et al.Microscopy (Oxford, England)|March 3, 2020
Enhancement of image contrast for carbon nanotube and polymer composite film in scanning electron microscopeYoichiro Hashimoto, Hiroyuki Ito, Masahiro SasajimaMicroscopy (Oxford, England)|October 1, 2020
Evaluation of depth of dislocation visibility in SEM electron channeling contrast imaging in Ti-6Al-4V alloy using serial sectioning methodShigeto Yamasaki, Misaki Deguchi, Masatoshi Mitsuhara, et al.Microscopy (Oxford, England)|October 21, 2022
Progress in spatial resolution of structural analysis by cryo-EMYoshiyuki Fukuda, Kevin Stapleton, Takayuki KatoMicroscopy (Oxford, England)|October 21, 2022
Attosecond electron-beam technology: a review of recent progressYuya MorimotoMicroscopy (Oxford, England)|October 21, 2022
Low-energy scanning transmission electron microscopy applied to ice-embedded biological macromoleculesHidehito Adaniya, Martin Cheung, Masao Yamashita, et al.Microscopy (Oxford, England)|January 27, 2021
A simple preparation method for CLEM using pre-embedding immunohistochemistry with a novel fluorescent probe and stable embedding resinTakaaki Kanemaru, Teruyoshi Kondo, Kei-Ichiro Nakamura, et al.Microscopy (Oxford, England)|January 12, 2022
Study of high-low KPFM on a pn-patterned Si surfaceRyo Izumi, Yan Jun Li, Yoshitaka Naitoh, et al.Microscopy (Oxford, England)|December 24, 2021
Microscopy and biomimetics: the NanoSuit® method and image retrieval platformTakahiko Hariyama, Yasuharu Takaku, Hideya Kawasaki, et al.Pageof 82