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Microscopy (Oxford, England)|February 29, 2024
A simple coordinate transformation method for quickly locating the features of interest in TEM samplesMingzhi Zeng, Wenzhao Wang, Yang Yin, et al.Microscopy (Oxford, England)|May 9, 2024
Bayesian inference of atomic column positions in scanning transmission electron microscopy imagesYuki Nomura, Satoshi Anada, Shunsuke KobayashiMicroscopy (Oxford, England)|September 20, 2024
Surface potential distribution of resist exposed by electron beam and the non-charging exposure conditionsMasatoshi Kotera, Yoshinobu KonoMicroscopy (Oxford, England)|February 19, 2026
Computing Initial Energy Distributions for Field Emission SourcesJohn Rouse, Catherine Rouse, Haoning LiuMicroscopy (Oxford, England)|May 12, 2026
Dynamic Scan Shaping: Overcoming Coil Hysteresis for High-Speed STEMJonathan J P Peters, Grigore Moldovan, Lewys JonesMicroscopy (Oxford, England)|May 21, 2026
In-situ biasing DPC STEM observation of GaAs p-n junctionSatoko Toyama, Yoshifumi Kojima, Ayumu Oyaizu, et al.Microscopy (Oxford, England)|April 4, 2026
Rigorous Computation of High-Order Aberrations and Their ErrorsKyoko Makino, Martin BerzMicroscopy (Oxford, England)|March 26, 2026
Partial coherence of inelastically scattered electrons in transmission electron microscopyBudhika Gehan MendisMicroscopy (Oxford, England)|November 1, 2014
Fast auto-acquisition tomography tilt series by using HD video camera in ultra-high voltage electron microscopeRyuji Nishi, Meng Cao, Atsuko Kanaji, et al.Microscopy (Oxford, England)|November 1, 2014
Observation of vortex domain structures in multiferroic hexagonal manganites RMnO3 by transmission electron microscopyYoichi Horibe, Fei-Ting Huang, Taekjib Choi, et al.Pageof 82