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Optics Letters|November 4, 2008
Optical binding and the influence of beam structureJusto Rodríguez, David L AndrewsOptics Letters|November 4, 2008
Carrier-injection-based electro-optic modulator on silicon-on-insulator with a heterogeneously integrated III-V microdisk cavityLiu Liu, Joris Van Campenhout, Günther Roelkens, et al.Optics Letters|November 4, 2008
Sensitivity enhancement of guided-wave surface-plasmon resonance sensorsAmit Lahav, Mark Auslender, I AbdulhalimOptics Letters|November 4, 2008
Fast f-to-2f interferometer for a direct measurement of the carrier-envelope phase drift of ultrashort amplified laser pulsesSebastian Koke, Christian Grebing, Bastian Manschwetus, et al.Optics Letters|November 4, 2008
Imaging performance of an isotropic negative dielectric constant slabShivanand, Huikan Liu, Kevin J WebbOptics Letters|August 19, 2008
Phase-shifting interferometry with feedback control using heterodyne phase detectionYouichi BitouOptics Letters|August 19, 2008
Multisoliton ejection from an amplifying potential trapAssaf Barak, Or Peleg, Avy Soffer, et al.Optics Letters|August 19, 2008
Optical phase erasure and its application to format conversion through cascaded second-order processes in periodically poled lithium niobateJian Wang, Junqiang Sun, Xinliang Zhang, et al.Optics Letters|August 19, 2008
Improved sectioning in a slit scanning confocal microscopeVincent Poher, Gordon T Kennedy, Hugh B Manning, et al.Optics Letters|August 19, 2008
Comment on "Resolving the wave vector and the refractive index from the coefficient of reflectance"Manuel Perez-Molina, Luis CarreteroPageof 4,385