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Scanning|June 7, 2005
An improved specimen loader for cryo-scanning electron microscopyRajgopal Iyer, M A Arunagirinathan, C S Prabhu, et al.
Scanning|August 11, 2006
Use of low-temperature scanning electron microscopy to compare and characterize three classes of snow coverJames Foster, Richard Kelly, Albert Rango, et al.
Scanning|December 14, 2007
Effect of surface conjugation chemistry on the sensitivity of microcantilever sensorsDae Jung Kim, Brandon L Weeks, Louisa J Hope-Weeks
Scanning|March 1, 2006
Aberration model of a multibeam scanning microscope for electron beam-induced depositionM J van Bruggen, B van Someren, P Kruit
Scanning|February 28, 2002
Line profile reconstruction from simultaneously recorded secondary and backscattered electron signalsXiaoyuan Li, Tetsuji Kodama, Yuki Mori, et al.
Scanning|February 28, 2002
An empirical energy loss equation of electronsTan Zhenyu, He Yancai
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