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Scanning|August 9, 2002
A method for personal expertise-independent evaluation of image resolution in scanning electron microscopyTohru Ishitani, Mitsugu SatoScanning|October 6, 2001
Light collection efficiency and light transport in backscattered electron scintillator detectors in scanning electron microscopyM N Filippov, E I Rau, R A Sennov, et al.Scanning|October 6, 2001
Experimental data and model simulations of beam spread in the environmental scanning electron microscopeS A WightScanning|October 6, 2001
Strategies for optimum use of superposition diffractogram in scanning electron microscopyE Oho, K ToyomuraScanning|September 6, 2001
Validation of three-dimensional surface characterising methods: scanning electron microscopy and confocal laser scanning microscopyB Al-Nawas, K A Grotz, H Götz, et al.Scanning|June 19, 2001
Image analysis of particle dispersions in microscopy images of cryo-sectioned sausagesA Kohler, V Høst, R OfstadScanning|June 19, 2001
Mapping piezoelectric-field distribution in gallium nitride with scanning second-harmonic generation microscopyC K Sun, S W Chu, S P Tai, et al.Scanning|October 24, 2002
Monte Carlo analysis of the detection of clay occlusion of respirable quartz particles using multiple voltage scanning electron microscopyV Hnizdo, W E WallaceScanning|June 21, 2002
Application of the scatter diagram technique to the scanning electron microscope: preliminary results from diamondJ M Patat, P Lehuede, O Durand, et al.Scanning|June 21, 2002
Guiding self-assembly with the tip of an atomic force microscopePatrick Mesquida, Andreas StemmerPageof 133