Jove
Visualize
Contact Us
JoVE
x logofacebook logolinkedin logoyoutube logo
ABOUT JoVE
OverviewLeadershipBlogJoVE Help Center
AUTHORS
Publishing ProcessEditorial BoardScope & PoliciesPeer ReviewFAQSubmit
LIBRARIANS
TestimonialsSubscriptionsAccessResourcesLibrary Advisory BoardFAQ
RESEARCH
JoVE JournalMethods CollectionsJoVE Encyclopedia of ExperimentsArchive
EDUCATION
JoVE CoreJoVE BusinessJoVE Science EducationJoVE Lab ManualFaculty Resource CenterFaculty Site
Terms & Conditions of Use
Privacy Policy
Policies

Filters

Scanning

Showing results (1151-1160 of 1,409) with videos related to

Pageof 141
Sort By:
Scanning|January 10, 2019
Next-Generation Energy Storage Materials Explored by Advanced Scanning TechniquesHuaiyu Shao, Hai-Wen Li, Ya-Jun Cheng, et al.
Scanning|November 20, 2019
Trueness and Precision of Two Intraoral Scanners: A Comparative In Vitro StudyRaul Nicolae Rotar, Anca Jivanescu, Codruta Ille, et al.
Scanning|December 15, 2017
<i>In Situ</i> SEM Nanomanipulation and Nanomechanical/Electrical CharacterizationYang Lu, Yajing Shen, Xinyu Liu, et al.
Scanning|March 20, 2018
Influence of Cu Content on the Microstructure and Mechanical Properties of Cr-Cu-N CoatingsJi Cheng Ding, Teng Fei Zhang, Zhi Xin Wan, et al.
Scanning|March 7, 2018
Magnetization Analysis by Spin-Polarized Scanning Electron MicroscopyTeruo Kohashi
Scanning|December 19, 2017
Error Aggregation in the Reengineering Process from 3D Scanning to PrintingJennifer G Michaeli, Matthew C DeGroff, Roman C Roxas
Scanning|January 5, 2002
Application of the low-loss scanning electron microscope image to integrated circuit technology part II--chemically-mechanically planarized samplesO C Wells, M McGlashan-Powell, A E Vladár, et al.
Scanning|August 9, 2002
Cryostatic micro-computed tomography imaging of arterial wall perfusionBirgit Kantor, Steven M Jorgensen, Patricia E Lund, et al.
Scanning|August 9, 2002
A method for personal expertise-independent evaluation of image resolution in scanning electron microscopyTohru Ishitani, Mitsugu Sato
Scanning|October 6, 2001
Light collection efficiency and light transport in backscattered electron scintillator detectors in scanning electron microscopyM N Filippov, E I Rau, R A Sennov, et al.
Pageof 141

Showing results (1151-1160 of 1,409) with videos related to

Sort By:
Pageof 141
Scanning|January 10, 2019
Next-Generation Energy Storage Materials Explored by Advanced Scanning TechniquesHuaiyu Shao, Hai-Wen Li, Ya-Jun Cheng, et al.
Scanning|November 20, 2019
Trueness and Precision of Two Intraoral Scanners: A Comparative In Vitro StudyRaul Nicolae Rotar, Anca Jivanescu, Codruta Ille, et al.
Scanning|December 15, 2017
<i>In Situ</i> SEM Nanomanipulation and Nanomechanical/Electrical CharacterizationYang Lu, Yajing Shen, Xinyu Liu, et al.
Scanning|March 20, 2018
Influence of Cu Content on the Microstructure and Mechanical Properties of Cr-Cu-N CoatingsJi Cheng Ding, Teng Fei Zhang, Zhi Xin Wan, et al.
Scanning|March 7, 2018
Magnetization Analysis by Spin-Polarized Scanning Electron MicroscopyTeruo Kohashi
Scanning|December 19, 2017
Error Aggregation in the Reengineering Process from 3D Scanning to PrintingJennifer G Michaeli, Matthew C DeGroff, Roman C Roxas
Scanning|January 5, 2002
Application of the low-loss scanning electron microscope image to integrated circuit technology part II--chemically-mechanically planarized samplesO C Wells, M McGlashan-Powell, A E Vladár, et al.
Scanning|August 9, 2002
Cryostatic micro-computed tomography imaging of arterial wall perfusionBirgit Kantor, Steven M Jorgensen, Patricia E Lund, et al.
Scanning|August 9, 2002
A method for personal expertise-independent evaluation of image resolution in scanning electron microscopyTohru Ishitani, Mitsugu Sato
Scanning|October 6, 2001
Light collection efficiency and light transport in backscattered electron scintillator detectors in scanning electron microscopyM N Filippov, E I Rau, R A Sennov, et al.
Pageof 141