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Scanning|March 3, 2007
On the production of X-rays by low energy ion beamsDavid C Joy, Harry M Meyer, Mehdi Bolorizadeh, et al.Scanning|December 22, 2006
Contactless optical scanning of fingerprints with 180 degrees viewJ Palma, C Liessner, S Mil'shteinScanning|December 22, 2006
Pressure effect of growing with electron beam-induced deposition with tungsten hexafluoride and tetraethylorthosilicate precursorYoung R Choi, Philip D Rack, Steven J Randolph, et al.Scanning|August 7, 2007
Mistakes encountered during automatic peak identification in low beam energy X-ray microanalysisDale E NewburyScanning|August 2, 2006
Corrections of magnification and focusing in a cathode lens-equipped scanning electron microscopeJ Zobacová, M Zobac, M Oral, et al.Scanning|August 2, 2006
Using the scanning electron microprobe and secondary ion mass spectrometry to locate 14C and 13C labelled plant residues within soil aggregatesNelly Blair, K E Prince, R D Faulkner, et al.Scanning|August 2, 2006
Microstructural changes of osmotically dehydrated tissues of apple, banana, and potatoCharles Tortoe, John OrchardScanning|August 11, 2006
Parameters and mechanisms governing image contrast in scanning electron microscopy of single-walled carbon nanotubesW K Wong, A Nojeh, R F W PeaseScanning|June 29, 2007
Scanning and transmission electron microscopy for evaluation of order/disorder in bone structureElena I Suvorova, Pavel P Petrenko, Philippe A BuffatScanning|May 5, 2007
Fluorescence quenching by colloidal heavy metals nanoparticles: implications for correlative fluorescence and electron microscopy studiesIrawati K Kandela, Ralph M AlbrechtPageof 133