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Scanning|May 1, 2012
Imaging and nanofabrication with the helium ion microscope of the Van Leeuwenhoek Laboratory in DelftPaul F A Alkemade, Emma M Koster, Emile van Veldhoven, et al.Scanning|April 19, 2012
Direct volume rendering methods for cell structuresDalibor Martišek, Karel MartišekScanning|September 8, 2011
The study on the atomic force microscopy base nanoscale electrical discharge machiningJen-Ching Huang, Chung-Ming ChenScanning|September 23, 2011
Dynamics of contact line motion during the wetting of rough surfaces and correlation with topographical surface parametersK J Kubiak, M C T Wilson, T G Mathia, et al.Scanning|October 15, 2011
Using metrology in early prehistoric stone tool research: further work and a brief instrument comparisonA A Evans, D MacdonaldScanning|August 3, 2011
Scanning of the internal structure part with laser ultrasonic in aviation industryPawel J SwornowskiScanning|July 29, 2011
Helium ion microscopy of Lepidoptera scalesStuart A Boden, Asa Asadollahbaik, Harvey N Rutt, et al.Scanning|July 29, 2011
The prospects of a subnanometer focused neon ion beamF H M Rahman, Shawn McVey, Louis Farkas, et al.Scanning|September 21, 2011
Multiphoton microscopic imaging of in vivo hair mouse skin based on two-photon excited fluorescence and second harmonic generationXingshan Jiang, Shuangmu Zhuo, Ren'an Xu, et al.Scanning|February 15, 2012
Roughness parameters for standard description of surface nanoarchitectureHayden K Webb, Vi Khanh Truong, Jafar Hasan, et al.Pageof 133