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Scanning|July 10, 2008
Simulated SEM images for resolution measurementP Cizmar, A E Vladár, B Ming, et al.
Scanning|June 29, 2007
Effect of electron beam-induced deposition and etching under biasYoung R Choi, Philip D Rack, Bernhard Frost, et al.
Scanning|February 5, 2009
Effect of fabrication process parameters on the apex-radius of STM tungsten nanotipGh Tahmasebipour, Y Hojjat, V Ahmadi, et al.
Scanning|February 5, 2009
Gloss phenomena and image analysis of atomic force microscopy in molecular and cell biologyJie Zhu, Tanya Sabharwal, Lianhong Guo, et al.
Scanning|September 15, 2022
Hydrothermal Corrosion of SiC Coupons Suppressed by Magnetron Sputtered Cr CoatingsShuxin Dai, Zhiming Zou, Renda Wang, et al.
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