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Scanning

Showing results (841-850 of 1,409) with videos related to

Pageof 141
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Scanning|July 24, 2013
Variability of areal surface topography parameters due to the change in surface orientation to measurement directionAndrzej Dzierwa, Rafal Reizer, Pawel Pawlus, et al.
Scanning|July 31, 2013
Special raster scanning for reduction of charging effects in scanning electron microscopyKazuhiko Suzuki, Eisaku Oho
Scanning|June 7, 2013
Study on effects of scan parameters on the image quality and tip wear in AFM tapping modeBo Xue, Yongda Yan, Zhenjiang Hu, et al.
Scanning|June 21, 2013
Reflection on the measurement and use of the topography of the indentation imprintJ Marteau, M Bigerelle, S Bouvier, et al.
Scanning|March 6, 2013
Roughness parameter selection for novel manufacturing processesM Ham, B M Powers
Scanning|May 1, 2012
Editorial: special issue on helium ion microscopyDavid C Bell
Scanning|May 4, 2012
Fractal analysis of two-photon microscopic images for diagnosis of nasopharyngeal cancerZufang Huang, Jianji Pan, Guannan Chen, et al.
Scanning|November 22, 2012
Label-free imaging characteristics of colonic mucinous adenocarcinoma using multiphoton microscopyNenrong Liu, Jianxin Chen, Renan Xu, et al.
Scanning|October 31, 2013
Challenging material patterning: fine lithography on coarse substratesSandra Gilles, Ann-Kathrin Steppert, Patrick A Schaal, et al.
Scanning|December 11, 2013
Performance of SEM scintillation detector evaluated by modulation transfer function and detective quantum efficiency functionJan Bok, Petr Schauer
Pageof 141

Showing results (841-850 of 1,409) with videos related to

Sort By:
Pageof 141
Scanning|July 24, 2013
Variability of areal surface topography parameters due to the change in surface orientation to measurement directionAndrzej Dzierwa, Rafal Reizer, Pawel Pawlus, et al.
Scanning|July 31, 2013
Special raster scanning for reduction of charging effects in scanning electron microscopyKazuhiko Suzuki, Eisaku Oho
Scanning|June 7, 2013
Study on effects of scan parameters on the image quality and tip wear in AFM tapping modeBo Xue, Yongda Yan, Zhenjiang Hu, et al.
Scanning|June 21, 2013
Reflection on the measurement and use of the topography of the indentation imprintJ Marteau, M Bigerelle, S Bouvier, et al.
Scanning|March 6, 2013
Roughness parameter selection for novel manufacturing processesM Ham, B M Powers
Scanning|May 1, 2012
Editorial: special issue on helium ion microscopyDavid C Bell
Scanning|May 4, 2012
Fractal analysis of two-photon microscopic images for diagnosis of nasopharyngeal cancerZufang Huang, Jianji Pan, Guannan Chen, et al.
Scanning|November 22, 2012
Label-free imaging characteristics of colonic mucinous adenocarcinoma using multiphoton microscopyNenrong Liu, Jianxin Chen, Renan Xu, et al.
Scanning|October 31, 2013
Challenging material patterning: fine lithography on coarse substratesSandra Gilles, Ann-Kathrin Steppert, Patrick A Schaal, et al.
Scanning|December 11, 2013
Performance of SEM scintillation detector evaluated by modulation transfer function and detective quantum efficiency functionJan Bok, Petr Schauer
Pageof 141