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October 25, 2007
Examples of charging effects on the spectral quality of X-ray microanalysis on a glass sample using the variable pressure scanning electron microscope
J F Le Berre, H Demers, G P Demopoulos, et al.
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July 10, 2008
Simulated SEM images for resolution measurement
P Cizmar, A E Vladár, B Ming, et al.
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|
July 11, 2008
Advanced semiconductor diagnosis by multidimensional electron-beam-induced current technique
J Chen, X Yuan, T Sekiguchi
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June 29, 2007
Effect of electron beam-induced deposition and etching under bias
Young R Choi, Philip D Rack, Bernhard Frost, et al.
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|
February 5, 2009
Effect of fabrication process parameters on the apex-radius of STM tungsten nanotip
Gh Tahmasebipour, Y Hojjat, V Ahmadi, et al.
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February 5, 2009
Gloss phenomena and image analysis of atomic force microscopy in molecular and cell biology
Jie Zhu, Tanya Sabharwal, Lianhong Guo, et al.
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September 15, 2022
Hydrothermal Corrosion of SiC Coupons Suppressed by Magnetron Sputtered Cr Coatings
Shuxin Dai, Zhiming Zou, Renda Wang, et al.
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September 15, 2022
Postoperative Nursing and Functional Rehabilitation of Ultrasound Diagnosis of Lower Rotator Cuff Injury
Riying Hou
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September 15, 2022
Diagnostic Value of Specialist Systems in Sports Knee Injuries
Xi Chen, Ao Yu, Ning Cai, et al.
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September 16, 2022
Clinical Analysis of Echocardiography and Serum IL-6 and TNF-<i>α</i> Changes in Pregnant Women with Hypertension
Ying Liu, Xiaolin Hou, Mei Yu, et al.
Page
of 141
Search research articles
Search
Showing results (881-890 of 1,409) with videos related to
Sort By:
Page
of 141
Scanning
|
October 25, 2007
Examples of charging effects on the spectral quality of X-ray microanalysis on a glass sample using the variable pressure scanning electron microscope
J F Le Berre, H Demers, G P Demopoulos, et al.
Scanning
|
July 10, 2008
Simulated SEM images for resolution measurement
P Cizmar, A E Vladár, B Ming, et al.
Scanning
|
July 11, 2008
Advanced semiconductor diagnosis by multidimensional electron-beam-induced current technique
J Chen, X Yuan, T Sekiguchi
Scanning
|
June 29, 2007
Effect of electron beam-induced deposition and etching under bias
Young R Choi, Philip D Rack, Bernhard Frost, et al.
Scanning
|
February 5, 2009
Effect of fabrication process parameters on the apex-radius of STM tungsten nanotip
Gh Tahmasebipour, Y Hojjat, V Ahmadi, et al.
Scanning
|
February 5, 2009
Gloss phenomena and image analysis of atomic force microscopy in molecular and cell biology
Jie Zhu, Tanya Sabharwal, Lianhong Guo, et al.
Scanning
|
September 15, 2022
Hydrothermal Corrosion of SiC Coupons Suppressed by Magnetron Sputtered Cr Coatings
Shuxin Dai, Zhiming Zou, Renda Wang, et al.
Scanning
|
September 15, 2022
Postoperative Nursing and Functional Rehabilitation of Ultrasound Diagnosis of Lower Rotator Cuff Injury
Riying Hou
Scanning
|
September 15, 2022
Diagnostic Value of Specialist Systems in Sports Knee Injuries
Xi Chen, Ao Yu, Ning Cai, et al.
Scanning
|
September 16, 2022
Clinical Analysis of Echocardiography and Serum IL-6 and TNF-<i>α</i> Changes in Pregnant Women with Hypertension
Ying Liu, Xiaolin Hou, Mei Yu, et al.
Page
of 141