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Scanning

Showing results (881-890 of 1,409) with videos related to

Pageof 141
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Scanning|October 25, 2007
Examples of charging effects on the spectral quality of X-ray microanalysis on a glass sample using the variable pressure scanning electron microscopeJ F Le Berre, H Demers, G P Demopoulos, et al.
Scanning|July 10, 2008
Simulated SEM images for resolution measurementP Cizmar, A E Vladár, B Ming, et al.
Scanning|July 11, 2008
Advanced semiconductor diagnosis by multidimensional electron-beam-induced current techniqueJ Chen, X Yuan, T Sekiguchi
Scanning|June 29, 2007
Effect of electron beam-induced deposition and etching under biasYoung R Choi, Philip D Rack, Bernhard Frost, et al.
Scanning|February 5, 2009
Effect of fabrication process parameters on the apex-radius of STM tungsten nanotipGh Tahmasebipour, Y Hojjat, V Ahmadi, et al.
Scanning|February 5, 2009
Gloss phenomena and image analysis of atomic force microscopy in molecular and cell biologyJie Zhu, Tanya Sabharwal, Lianhong Guo, et al.
Scanning|September 15, 2022
Hydrothermal Corrosion of SiC Coupons Suppressed by Magnetron Sputtered Cr CoatingsShuxin Dai, Zhiming Zou, Renda Wang, et al.
Scanning|September 15, 2022
Postoperative Nursing and Functional Rehabilitation of Ultrasound Diagnosis of Lower Rotator Cuff InjuryRiying Hou
Scanning|September 15, 2022
Diagnostic Value of Specialist Systems in Sports Knee InjuriesXi Chen, Ao Yu, Ning Cai, et al.
Scanning|September 16, 2022
Clinical Analysis of Echocardiography and Serum IL-6 and TNF-<i>α</i> Changes in Pregnant Women with HypertensionYing Liu, Xiaolin Hou, Mei Yu, et al.
Pageof 141

Showing results (881-890 of 1,409) with videos related to

Sort By:
Pageof 141
Scanning|October 25, 2007
Examples of charging effects on the spectral quality of X-ray microanalysis on a glass sample using the variable pressure scanning electron microscopeJ F Le Berre, H Demers, G P Demopoulos, et al.
Scanning|July 10, 2008
Simulated SEM images for resolution measurementP Cizmar, A E Vladár, B Ming, et al.
Scanning|July 11, 2008
Advanced semiconductor diagnosis by multidimensional electron-beam-induced current techniqueJ Chen, X Yuan, T Sekiguchi
Scanning|June 29, 2007
Effect of electron beam-induced deposition and etching under biasYoung R Choi, Philip D Rack, Bernhard Frost, et al.
Scanning|February 5, 2009
Effect of fabrication process parameters on the apex-radius of STM tungsten nanotipGh Tahmasebipour, Y Hojjat, V Ahmadi, et al.
Scanning|February 5, 2009
Gloss phenomena and image analysis of atomic force microscopy in molecular and cell biologyJie Zhu, Tanya Sabharwal, Lianhong Guo, et al.
Scanning|September 15, 2022
Hydrothermal Corrosion of SiC Coupons Suppressed by Magnetron Sputtered Cr CoatingsShuxin Dai, Zhiming Zou, Renda Wang, et al.
Scanning|September 15, 2022
Postoperative Nursing and Functional Rehabilitation of Ultrasound Diagnosis of Lower Rotator Cuff InjuryRiying Hou
Scanning|September 15, 2022
Diagnostic Value of Specialist Systems in Sports Knee InjuriesXi Chen, Ao Yu, Ning Cai, et al.
Scanning|September 16, 2022
Clinical Analysis of Echocardiography and Serum IL-6 and TNF-<i>α</i> Changes in Pregnant Women with HypertensionYing Liu, Xiaolin Hou, Mei Yu, et al.
Pageof 141