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The Review of Scientific Instruments|June 3, 2010
A micromachined pressure sensor based on an array of microswitchesChang-Sin Park, Dong-Weon LeeThe Review of Scientific Instruments|June 3, 2010
Nanoradian angular stabilization of x-ray optical componentsStanislav Stoupin, Frank Lenkszus, Robert Laird, et al.The Review of Scientific Instruments|June 3, 2010
High speed wafer scale bulge testing for the determination of thin film mechanical propertiesM P Orthner, L W Rieth, F SolzbacherThe Review of Scientific Instruments|June 3, 2010
Note: X-ray radiography for measuring chemical diffusion in metallic meltsA Griesche, B Zhang, E Solórzano, et al.The Review of Scientific Instruments|June 3, 2010
Wavelength stabilization of a synchronously pumped optical parametric oscillator: optimizing proportional-integral controlTobias P Lamour, Jinghua Sun, Derryck T ReidThe Review of Scientific Instruments|June 3, 2010
Optical sensing and determination of complex reflection coefficients of plasmonic structures using transmission interferometric plasmonic sensorTakumi Sannomiya, Tobias E Balmer, Christian Hafner, et al.The Review of Scientific Instruments|June 3, 2010
Direct spectral phase measurement with spectral interferometry resolved in time extra dimensionalD Bigourd, J Luce, E Mazataud, et al.The Review of Scientific Instruments|June 3, 2010
Instrumentation for the in situ control of carrier recombination characteristics during irradiation by protonsE Gaubas, A Uleckas, J Vaitkus, et al.The Review of Scientific Instruments|June 3, 2010
X-ray microfabrication and measurement of a terahertz mode converterT H Chang, B Y Shew, C Y Wu, et al.The Review of Scientific Instruments|June 3, 2010
Design, development, and evaluation of a simple blackbody radiative sourceR Castrejón-García, J R Castrejón-Pita, A A Castrejón-PitaPageof 2,071