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The Review of Scientific Instruments|October 2, 2009
A Seeman-Bohlin geometry for high-resolution nanosecond x-ray diffraction measurements from shocked polycrystalline and amorphous materialsD Milathianaki, J Hawreliak, J M McNaney, et al.
The Review of Scientific Instruments|October 2, 2009
A frequency-domain thermoreflectance method for the characterization of thermal propertiesAaron J Schmidt, Ramez Cheaito, Matteo Chiesa
The Review of Scientific Instruments|October 2, 2009
A silicon photomultiplier readout for time of flight neutron spectroscopy with gamma-ray detectorsA Pietropaolo, G Gorini, G Festa, et al.
The Review of Scientific Instruments|October 2, 2009
In situ measurement of gas composition changes in radio frequency plasmas using a quartz sensorAtsushi Suzuki, Hidehiko Nonaka
The Review of Scientific Instruments|October 2, 2009
A high-precision apparatus for the characterization of thermal interface materialsR Kempers, P Kolodner, A Lyons, et al.
The Review of Scientific Instruments|October 2, 2009
Measuring the cantilever-position-sensitive detector distance and cantilever curvature for cantilever sensor applicationsMeng Xu, Ye Tian, M L Coates, et al.
The Review of Scientific Instruments|September 4, 2009
Toward ultrafast time-resolved Debye-Scherrer x-ray diffraction using a laser-plasma sourceU Shymanovich, M Nicoul, W Lu, et al.
The Review of Scientific Instruments|September 4, 2009
A compact molecular beam machinePaul Jansen, David W Chandler, Kevin E Strecker
The Review of Scientific Instruments|September 4, 2009
An open source/real-time atomic force microscope architecture to perform customizable force spectroscopy experimentsDonatello Materassi, Paolo Baschieri, Bruno Tiribilli, et al.
The Review of Scientific Instruments|September 4, 2009
Flexible electronics sensors for tactile multiscanningWen-Yang Chang, Te-Hua Fang, Yu-Tang Shen, et al.
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