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The Review of Scientific Instruments|December 3, 2015
Diagnosing x-ray power and energy of tungsten wire array z-pinch with a flat spectral response x-ray diodeKun-lun Wang, Xiao-dong Ren, Xian-bin Huang, et al.The Review of Scientific Instruments|December 3, 2015
A modular reactor design for in situ synchrotron x-ray investigation of atomic layer deposition processesJeffrey A Klug, Matthew S Weimer, Jonathan D Emery, et al.The Review of Scientific Instruments|December 3, 2015
An apparatus for spatially resolved, temperature dependent reflectance measurements for identifying thermochromism in combinatorial thin film librariesS C Barron, M P Patel, Nam Nguyen, et al.The Review of Scientific Instruments|December 3, 2015
Containment system for experiments on radioactive and other hazardous materials in a Paris-Edinburgh pressM K Jacobsen, N VelisavljevicThe Review of Scientific Instruments|December 3, 2015
Collection-efficient, axisymmetric vacuum sublimation module for the purification of solid materialsMichael May, Elizabeth Paul, Vladimir KatovicThe Review of Scientific Instruments|December 3, 2015
Signal acquisition module design for multi-channel surface magnetic resonance sounding systemTingting Lin, Wuqiang Chen, Wenyuan Du, et al.The Review of Scientific Instruments|December 3, 2015
A high-overtone bulk acoustic wave resonator-oscillator-based 4.596 GHz frequency source: Application to a coherent population trapping Cs vapor cell atomic clockThomas Daugey, Jean-Michel Friedt, Gilles Martin, et al.The Review of Scientific Instruments|December 3, 2015
A reliable, compact, and repetitive-rate high power microwave generation systemWei Li, Zhi-qiang Li, Xiao-liang Sun, et al.The Review of Scientific Instruments|December 3, 2015
A short-circuited coplanar waveguide to measure the permeability of magnetic thin films: Comparison with short-circuited microstrip lineJinwu Wei, Hongmei Feng, Zengtai Zhu, et al.The Review of Scientific Instruments|December 3, 2015
Dancing the tight rope on the nanoscale--Calibrating a heat flux sensor of a scanning thermal microscopeK Kloppstech, N Könne, L Worbes, et al.Pageof 2,068