Jove
Visualize
Contact Us
JoVE
x logofacebook logolinkedin logoyoutube logo
ABOUT JoVE
OverviewLeadershipBlogJoVE Help Center
AUTHORS
Publishing ProcessEditorial BoardScope & PoliciesPeer ReviewFAQSubmit
LIBRARIANS
TestimonialsSubscriptionsAccessResourcesLibrary Advisory BoardFAQ
RESEARCH
JoVE JournalMethods CollectionsJoVE Encyclopedia of ExperimentsArchive
EDUCATION
JoVE CoreJoVE BusinessJoVE Science EducationJoVE Lab ManualFaculty Resource CenterFaculty Site
Terms & Conditions of Use
Privacy Policy
Policies

Filters

Ultramicroscopy

Showing results (1-10 of 4,737) with videos related to

Pageof 474
Sort By:
Ultramicroscopy|October 8, 2020
Deep learning for scanning electron microscopy: Synthetic data for the nanoparticles detectionA Yu Kharin
Ultramicroscopy|January 31, 2020
Advancing characterisation with statistics from correlative electron diffraction and X-ray spectroscopy, in the scanning electron microscopeT P McAuliffe, A Foden, C Bilsland, et al.
Ultramicroscopy|January 1, 1988
Application of the "imaging plate" to TEM image recordingN Mori, T Oikawa, T Katoh, et al.
Ultramicroscopy|January 1, 1988
Three-dimensional reconstruction from electron micrographs of disordered specimens. II. Implementation and resultsR H Vogel, S W Provencher
Ultramicroscopy|June 28, 2023
Corrigendum to 'Quantitative mapping of strain and displacement fields over HR-TEM and HR-STEM images of crystals with reference to a virtual lattice' Ultramicroscopy 253 (2023) 113778>N Cherkashin, A Louiset, A Chmielewski, et al.
Ultramicroscopy|June 13, 2021
High-resolution compositional mapping of surfaces in non-contact atomic force microscopy by a new multi-frequency excitationMostafa Ghanbari Kouchaksaraei, Arash Bahrami
Ultramicroscopy|March 11, 2020
Spin structure relation to phase contrast imaging of isolated magnetic Bloch and Néel skyrmionsS Pöllath, T Lin, N Lei, et al.
Ultramicroscopy|November 21, 2022
A comparison of molecular dynamics potentials used to account for thermal diffuse scattering in multislice simulationsXi Chen, Dennis S Kim, James M LeBeau
Ultramicroscopy|December 25, 2022
Near-real-time diagnosis of electron optical phase aberrations in scanning transmission electron microscopy using an artificial neural networkGiovanni Bertoni, Enzo Rotunno, Daan Marsmans, et al.
Ultramicroscopy|June 21, 2021
Site-specific plan-view TEM lamella preparation of pristine surfaces with a large field of viewTobias Meyer, Tobias Westphal, Birte Kressdorf, et al.
Pageof 474

Showing results (1-10 of 4,737) with videos related to

Sort By:
Pageof 474
Ultramicroscopy|October 8, 2020
Deep learning for scanning electron microscopy: Synthetic data for the nanoparticles detectionA Yu Kharin
Ultramicroscopy|January 31, 2020
Advancing characterisation with statistics from correlative electron diffraction and X-ray spectroscopy, in the scanning electron microscopeT P McAuliffe, A Foden, C Bilsland, et al.
Ultramicroscopy|January 1, 1988
Application of the "imaging plate" to TEM image recordingN Mori, T Oikawa, T Katoh, et al.
Ultramicroscopy|January 1, 1988
Three-dimensional reconstruction from electron micrographs of disordered specimens. II. Implementation and resultsR H Vogel, S W Provencher
Ultramicroscopy|June 28, 2023
Corrigendum to 'Quantitative mapping of strain and displacement fields over HR-TEM and HR-STEM images of crystals with reference to a virtual lattice' Ultramicroscopy 253 (2023) 113778>N Cherkashin, A Louiset, A Chmielewski, et al.
Ultramicroscopy|June 13, 2021
High-resolution compositional mapping of surfaces in non-contact atomic force microscopy by a new multi-frequency excitationMostafa Ghanbari Kouchaksaraei, Arash Bahrami
Ultramicroscopy|March 11, 2020
Spin structure relation to phase contrast imaging of isolated magnetic Bloch and Néel skyrmionsS Pöllath, T Lin, N Lei, et al.
Ultramicroscopy|November 21, 2022
A comparison of molecular dynamics potentials used to account for thermal diffuse scattering in multislice simulationsXi Chen, Dennis S Kim, James M LeBeau
Ultramicroscopy|December 25, 2022
Near-real-time diagnosis of electron optical phase aberrations in scanning transmission electron microscopy using an artificial neural networkGiovanni Bertoni, Enzo Rotunno, Daan Marsmans, et al.
Ultramicroscopy|June 21, 2021
Site-specific plan-view TEM lamella preparation of pristine surfaces with a large field of viewTobias Meyer, Tobias Westphal, Birte Kressdorf, et al.
Pageof 474