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Ultramicroscopy|April 25, 2016
Correlation-steered scanning for scanning probe microscopes to overcome thermal drift for ultra-long time scanningLiansheng Zhang, Qian Long, Yongbin Liu, et al.Ultramicroscopy|April 17, 2016
Pixelated detectors and improved efficiency for magnetic imaging in STEM differential phase contrastMatus Krajnak, Damien McGrouther, Dzmitry Maneuski, et al.Ultramicroscopy|May 11, 2016
Parallel preparation of plan-view transmission electron microscopy specimens by vapor-phase etching with integrated etch stopsTimothy S English, J Provine, Ann F Marshall, et al.Ultramicroscopy|December 3, 2015
Segmentation of 3D EBSD data for subgrain boundary identification and feature characterizationAndrew Loeb, Michael Ferry, Lori BassmanUltramicroscopy|December 2, 2015
Reply to L.M. Brown et al. "Brief history of the Cambridge STEM aberration correction project and its progeny" in Ultramicroscopy 157, 88 (2015)K W Urban, H RoseUltramicroscopy|December 2, 2015
Outwitting the series resistance in scanning spreading resistance microscopyA Schulze, R Cao, P Eyben, et al.Ultramicroscopy|October 24, 2017
A quantitative method for measuring small residual beam tilts in high-resolution transmission electron microscopyWenquan Ming, Jianghua Chen, Christopher S Allen, et al.Ultramicroscopy|July 31, 2022
Linear imaging theory for differential phase contrast and other phase imaging modes in scanning transmission electron microscopyTakehito Seki, Kushagra Khare, Yoshiki O Murakami, et al.Ultramicroscopy|April 2, 2017
EMCD with an electron vortex filter: Limitations and possibilitiesT Schachinger, S Löffler, A Steiger-Thirsfeld, et al.Pageof 460