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Ultramicroscopy|May 3, 2024
Systematic study of FIB-induced damage for the high-quality TEM sample preparationJun Uzuhashi, Tadakatsu OhkuboUltramicroscopy|May 4, 2024
Magnetic domain wall dynamics studied by in-situ Lorentz microscopy with aid of custom-made Hall-effect sensor holderMari Honkanen, Henri Lukinmaa, Sami Kaappa, et al.Ultramicroscopy|October 12, 2023
Mean inner potential of elemental crystals from density-functional theory calculations: Efficient computation and trendsAvi Auslender, Nivedita Pandey, Amit Kohn, et al.Ultramicroscopy|October 16, 2023
Self-supervised noise modeling and sparsity guided electron tomography volumetric image denoisingZhidong Yang, Dawei Zang, Hongjia Li, et al.Ultramicroscopy|October 5, 2023
Dose symmetric electron diffraction tomography (DS-EDT): Implementation of a dose-symmetric tomography scheme in 3D electron diffractionEmre Yörük, Holger Klein, Stéphanie KodjikianUltramicroscopy|October 1, 2023
Atom counting from a combination of two ADF STEM imagesD G Şentürk, C P Yu, A De Backer, et al.Ultramicroscopy|October 2, 2024
A simple and intuitive model for long-range 3D potential distributions of in-operando TEM-samples: Comparison with electron holographic tomographyHüseyin Çelik, Robert Fuchs, Simon Gaebel, et al.Ultramicroscopy|September 20, 2024
A new method for estimating nanoparticle deposition coverage from a set of weak-contrast SEM imagesBchara Sidnawi, Liang Zhao, Bo Li, et al.Ultramicroscopy|September 14, 2024
Atomic resolution scanning transmission electron microscopy at liquid helium temperatures for quantum materialsJunsik Mun, Daniel Potemkin, Houk Jang, et al.Ultramicroscopy|June 7, 2023
Neutral helium atom microscopyAdrià Salvador Palau, Sabrina Daniela Eder, Gianangelo Bracco, et al.Pageof 458