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Ultramicroscopy|June 10, 2026
A knowledge-guided, drift-aware computer vision pipeline for automated nanoscale atomic force microscope surface characterizationT Karakoyun Barandır, Derya Gemici Deveci, Ö Ünverdi, et al.Ultramicroscopy|December 9, 2008
Controlled growth and formation of SAMs investigated by atomic force microscopySaju Pillai, Ranjith Krishna PaiUltramicroscopy|March 19, 2026
A microscope- auxiliary device to profile the setae patterns of earthworm species; a study on Eudrilus eugeniae, Lampito mauritii, Pontoscolex corethrurus, and Perionyx ceylanensisVijithkumar Vijayan, Sudhakar SivasubramaniamUltramicroscopy|May 26, 2026
Estimation of phosphorus concentration in doped silicon substrates using atom probe tomographyJun-Peng Su, Tung-Huan Chou, Yu-Chen Yang, et al.Ultramicroscopy|July 21, 2023
Investigation on the precipitate morphology and fraction characterization by atomic force microscopyXu Lijun, Liu Zhiwen, Xu Haifeng, et al.Ultramicroscopy|July 23, 2023
WRAP: A wavelet-regularised reconstruction algorithm for magnetic vector electron tomographyGeorge R Lewis, Daniel Wolf, Axel Lubk, et al.Ultramicroscopy|July 17, 2023
Coherent imaging with low-energy electrons, quantitative analysisTatiana LatychevskaiaUltramicroscopy|August 6, 2023
Fifth-order asymptotic geometric aberrations of electron lensesZhixiong LiuUltramicroscopy|July 29, 2023
2D imaging spin-filter for NanoESCA based on Au/Ir(001) or Fe(001)-p(1×1)OM Escher, N B Weber, T-J Kühn, et al.Ultramicroscopy|July 10, 2023
A Denoising Autoencoder for Improved Kikuchi Pattern Quality and Indexing in Electron Backscatter DiffractionCaleb E Andrews, Maria Strantza, Nicholas P Calta, et al.Pageof 458