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Ultramicroscopy|June 10, 2026
A knowledge-guided, drift-aware computer vision pipeline for automated nanoscale atomic force microscope surface characterizationT Karakoyun Barandır, Derya Gemici Deveci, Ö Ünverdi, et al.Ultramicroscopy|December 9, 2008
Controlled growth and formation of SAMs investigated by atomic force microscopySaju Pillai, Ranjith Krishna PaiUltramicroscopy|March 19, 2026
A microscope- auxiliary device to profile the setae patterns of earthworm species; a study on Eudrilus eugeniae, Lampito mauritii, Pontoscolex corethrurus, and Perionyx ceylanensisVijithkumar Vijayan, Sudhakar SivasubramaniamUltramicroscopy|May 26, 2026
Estimation of phosphorus concentration in doped silicon substrates using atom probe tomographyJun-Peng Su, Tung-Huan Chou, Yu-Chen Yang, et al.Ultramicroscopy|November 19, 2019
Low-energy in-line electron holographic imaging of vitreous ice-embedded small biomolecules using a modified scanning electron microscopeMartin Cheung, Hidehito Adaniya, Cathal Cassidy, et al.Ultramicroscopy|February 25, 2014
Is there a Stobbs factor in atomic-resolution STEM-EELS mapping?Huolin L Xin, Christian Dwyer, David A MullerUltramicroscopy|December 2, 2014
Modified Bethe formula for low-energy electron stopping power without fitting parametersHieu T Nguyen-TruongUltramicroscopy|December 25, 2016
The refractive index in electron microscopy and the errors of its approximationsM LentzenUltramicroscopy|April 24, 2017
On the role of the second-order derivative term in the calculation of convergent beam diffraction patternsS C Hillier, E T Robertson, G D Reid, et al.Ultramicroscopy|August 1, 1977
Calculation of the cross sections of electron interaction with matterF Arnal, J L Balladore, G Soum, et al.Pageof 460