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Ultramicroscopy|July 6, 2023
The influence of residual plural scattering after deconvolution in electron magnetic chiral dichroismZ Zeng, X Fu, Q Hu, et al.Ultramicroscopy|July 7, 2023
Removal of silicon-containing contaminants from TEM specimensDong Sheng HeUltramicroscopy|July 3, 2023
Effect of Ni substitution on the antiferromagnetic domains of cobalt oxideAnna Mandziak, Juan de la Figuera, Adrian Quesada, et al.Ultramicroscopy|November 19, 2019
Low-energy in-line electron holographic imaging of vitreous ice-embedded small biomolecules using a modified scanning electron microscopeMartin Cheung, Hidehito Adaniya, Cathal Cassidy, et al.Ultramicroscopy|February 25, 2014
Is there a Stobbs factor in atomic-resolution STEM-EELS mapping?Huolin L Xin, Christian Dwyer, David A MullerUltramicroscopy|December 2, 2014
Modified Bethe formula for low-energy electron stopping power without fitting parametersHieu T Nguyen-TruongUltramicroscopy|December 25, 2016
The refractive index in electron microscopy and the errors of its approximationsM LentzenUltramicroscopy|April 24, 2017
On the role of the second-order derivative term in the calculation of convergent beam diffraction patternsS C Hillier, E T Robertson, G D Reid, et al.Ultramicroscopy|August 1, 1977
Calculation of the cross sections of electron interaction with matterF Arnal, J L Balladore, G Soum, et al.Ultramicroscopy|February 26, 2011
Influence of confocal scanning laser microscopy specific acquisition parameters on the detection and matching of speeded-up robust featuresStefan G Stanciu, Radu Hristu, George A StanciuPageof 458