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Ultramicroscopy|March 30, 2007
Aspects of the performance of a femtosecond laser-pulsed 3-dimensional atom probeA Cerezo, P H Clifton, A Gomberg, et al.Ultramicroscopy|February 3, 2007
Mass thickness determination and microanalysis of thin films in the TEM--revisitedI PozsgaiUltramicroscopy|December 7, 2007
Progress and perspectives for atomic-resolution electron microscopyDavid J SmithUltramicroscopy|October 5, 2007
Scanning tunneling microscopy of Fe- and O-sublattices on Fe3O4(100)D Stoltz, A Onsten, U O Karlsson, et al.Ultramicroscopy|July 16, 2008
Towards better 3-D reconstructions by combining electron tomography and atom-probe tomographyIlke Arslan, Emmanuelle A Marquis, Mark Homer, et al.Ultramicroscopy|September 8, 2007
In-line holographic electron microscopy in the presence of external magnetic fieldsLucian Livadaru, Josh Mutus, Robert A WolkowUltramicroscopy|December 1, 2009
Characterization of Si nanocrystals by different TEM-based techniquesL Nikolova, R G Saint-Jacques, G G RossUltramicroscopy|April 7, 2009
Immobilization and characterization of ferritin on gold electrodeChul Wan Park, Hyun Ju Park, Ji Hyeon Kim, et al.Ultramicroscopy|February 10, 2009
Quantitative comparison of energy-filtering transmission electron microscopy and atom probe tomographyPatrick Stender, Tobias Heil, Helmut Kohl, et al.Ultramicroscopy|June 14, 2011
Macroscopic electrical field distribution and field-induced surface stresses of needle-shaped field emittersCharles Moy, Gianluca Ranzi, T C Petersen, et al.Pageof 458