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Is atomic resolution transmission electron microscopy able to resolve and refine amorphous structures?

D Van Dyck¹, S Van Aert, A J den Dekker

¹Department of Physics, University of Antwerp (RUCA), Groenenborgerlaan 171, 2020 Antwerp, Belgium. dvd@ruca.ua.ac.be

Ultramicroscopy

|November 12, 2003

Summary

Atomic resolution transmission electron microscopy can refine amorphous structures at the atomic level for thin samples. For thicker materials, electron tomography is necessary for atomic-level resolution and refinement.

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Area of Science:

Materials Science
Microscopy

Background:

Atomic resolution transmission electron microscopy (ARTEM) faces limitations in resolving amorphous structures.
Aberration-free microscopes enhance resolution but are constrained by sample thickness.

Purpose of the Study:

To explore the capabilities and limitations of ARTEM for amorphous structure analysis.
To identify alternative methods for resolving thicker amorphous materials.

Main Methods:

Utilizing aberration-free atomic resolution transmission electron microscopy.
Investigating the impact of foil thickness on structural resolution.
Applying electron tomography for thicker samples.

Main Results:

High precision (0.01 Å) is achievable for very thin amorphous foils.

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Extended recording times are necessary, particularly for light atoms.

Electron tomography is essential for resolving thicker amorphous structures.

Conclusions:

ARTEM is effective for thin amorphous samples, requiring significant time for light elements.
Electron tomography provides a viable solution for atomic-level analysis of thicker amorphous materials.