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Ultramicroscopy|July 9, 2013
On the optical stability of high-resolution transmission electron microscopesJ Barthel, A ThustUltramicroscopy|April 23, 2013
Characterization of detector modulation-transfer function with noise, edge, and holographic methodsRobert A McLeod, Marek MalacUltramicroscopy|September 21, 2013
Effect of horizontal magnetization reversal of the tips on magnetic force microscopy imagesAlexander Alekseev, Anatoliy Popkov, Andrey Shubin, et al.Ultramicroscopy|August 1, 2016
Comprehensive analysis of TEM methods for LiFePO4/FePO4 phase mapping: spectroscopic techniques (EFTEM, STEM-EELS) and STEM diffraction techniques (ACOM-TEM)X Mu, A Kobler, D Wang, et al.Ultramicroscopy|January 3, 2016
Clustered field evaporation of metallic glasses in atom probe tomographyJ Zemp, S S A Gerstl, J F Löffler, et al.Ultramicroscopy|January 19, 2016
STEM-EDX tomography of bimetallic nanoparticles: A methodological investigationThomas J A Slater, Arne Janssen, Pedro H C Camargo, et al.Ultramicroscopy|September 9, 2017
Optimization of monochromated TEM for ultimate resolution imaging and ultrahigh resolution electron energy loss spectroscopySergei Lopatin, Bin Cheng, Wei-Ting Liu, et al.Ultramicroscopy|February 16, 2017
The atomic structure of polar and non-polar InGaN quantum wells and the green gap problemC J Humphreys, J T Griffiths, F Tang, et al.Ultramicroscopy|March 5, 2017
Application of EELS and EFTEM to the life sciences enabled by the contributions of Ondrej KrivanekRichard D LeapmanUltramicroscopy|December 25, 2016
3D elemental mapping with nanometer scale depth resolution via electron optical sectioningTimothy J Pennycook, Hao Yang, Lewys Jones, et al.Pageof 460