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Ultramicroscopy|July 21, 2026
edXTrace: A ray tracing software tool for correcting absorption effects and detector shadowing for EDXS quantification in the TEMN Grogger, M Oberaigner, J Lammer, et al.Ultramicroscopy|August 7, 2026
Preserving spatial and energy resolution in multi-dimensional hyperspectral image datasets via rigid image registrationYifeng Huang, Xingxu Yan, Toshihiro Aoki, et al.Ultramicroscopy|September 22, 2026
High resolution large working distance scanning helium microscopyS M Lambrick, N A von Jeinsen, A Radić, et al.Ultramicroscopy|September 7, 2026
Noise correlation and phase resolution in off-axis electron holographyLuyang Wang, Ye Luo, Xiaowen Chen, et al.Ultramicroscopy|October 19, 2026
Pushing the dose limit of atomic-resolution imaging: A 4D-STEM case study of NaClTamazouzt Chennit, Arno Annys, Songge Li, et al.Ultramicroscopy|May 4, 2001
Strul--a method for 3D alignment of single-particle projections based on common line correlation in Fourier spaceM LindahlUltramicroscopy|May 4, 2001
An accurate analytical approach to electron crystallographyQ Yang, Y Wang, Q Liu, et al.Ultramicroscopy|May 4, 2001
Imaging conditions for reliable measurement of displacement and strain in high-resolution electron microscopyM J Hÿtch, T PlamannUltramicroscopy|September 8, 2001
Glassy cholesteric structure: thickness variation induced by electron radiation in transmission electron microscopy investigated by atomic force microscopyA Boudet, M Mitov, C Bourgerette, et al.Ultramicroscopy|September 8, 2001
Optimization of digital filters for the detection of trace elements in EELS. III--Gaussian, homomorphic and adaptive filtersJ Michel, N BonnetPageof 460