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Ultramicroscopy|April 20, 2001
Electric charging of thin films measured using the contrast transfer functionK Danov, R Danev, K NagayamaUltramicroscopy|April 20, 2001
Crystal thickness and extinction distance determination using energy filtered CBED pattern intensity measurement and dynamical diffraction theory fittingD Delille, R Pantel, E Van CappellenUltramicroscopy|April 20, 2001
Accurate length determination of DNA molecules visualized by atomic force microscopy: evidence for a partial B- to A-form transition on micaC Rivetti, S CodeluppiUltramicroscopy|April 20, 2001
Semi-automatized processing of AFM force-spectroscopy dataC Gergely, B Senger, J C Voegel, et al.Ultramicroscopy|April 20, 2001
Determination of the orientation in small areas of the exit waveR M Bokel, J Jansen, H W ZandbergenUltramicroscopy|December 31, 2002
Measuring the PSF from aperture images of arbitrary shape--an algorithmP N H Nakashima, A W S JohnsonUltramicroscopy|December 31, 2002
Semiconductor dopant profiling by off-axis electron holographyJing Li, M R McCartney, David J SmithUltramicroscopy|June 13, 2003
Dependence of tunneling current through a single molecule of phenylene oligomers on the molecular lengthSatoshi Wakamatsu, Shintaro Fujii, Uichi Akiba, et al.Ultramicroscopy|June 13, 2003
Scanning tunneling microscopy of 1, 2, and 3 layers of electroactive compoundsDan Barlow, Louis Scudiero, K W HippsUltramicroscopy|June 13, 2003
AFM and STM study of beta-amyloid aggregation on graphiteZhigang Wang, Chunqing Zhou, Chen Wang, et al.Pageof 460