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Ultramicroscopy|June 13, 2003
Dependence of tunneling current through a single molecule of phenylene oligomers on the molecular lengthSatoshi Wakamatsu, Shintaro Fujii, Uichi Akiba, et al.Ultramicroscopy|June 13, 2003
Scanning tunneling microscopy of 1, 2, and 3 layers of electroactive compoundsDan Barlow, Louis Scudiero, K W HippsUltramicroscopy|June 13, 2003
AFM and STM study of beta-amyloid aggregation on graphiteZhigang Wang, Chunqing Zhou, Chen Wang, et al.Ultramicroscopy|June 13, 2003
Atomic force microscope characterization of a resonating nanocantileverG Abadal, Z J Davis, X Borrisé, et al.Ultramicroscopy|June 13, 2003
In-plane contributions to phase contrast in intermittent contact atomic force microscopyMatthew S Marcus, M A Eriksson, Darryl Y Sasaki, et al.Ultramicroscopy|June 13, 2003
Imaging cobalt nanoparticles by amplitude modulation atomic force microscopy: comparison between low and high amplitude solutionsM Tello, A San Paulo, T R Rodríguez, et al.Ultramicroscopy|June 13, 2003
Large fluctuations in the disassembly rate of microtubules revealed by atomic force microscopyNeil H Thomson, Sandor Kasas, Beat M Riederer, et al.Ultramicroscopy|June 13, 2003
Intersegmental interactions in supercoiled DNA: atomic force microscope studyLuda S Shlyakhtenko, Lela Miloseska, Vladimir N Potaman, et al.Ultramicroscopy|June 13, 2003
Chiral discrimination of basic and hydrophobic molecules by chemical force spectroscopyMrinal Mahapatro, Christopher Gibson, Chris Abell, et al.Ultramicroscopy|June 13, 2003
A study of topographic effects on chemical force microscopy using adhesive force mappingFuminobu Sato, Hiroki Okui, Uichi Akiba, et al.Pageof 458