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Ultramicroscopy|July 19, 2011
Fabrication and analysis of cylindrical resin AFM microcantileversD Cheneler, J Bowen, S J Leigh, et al.Ultramicroscopy|June 14, 2011
APT analysis of WC-Co based cemented carbidesJonathan Weidow, Hans-Olof AndrénUltramicroscopy|June 14, 2011
Mask-assisted deterministic phase-amplitude retrieval from a single far-field intensity diffraction pattern: two experimental proofs of principle using visible lightSergey G Podorov, Alexis I Bishop, David M Paganin, et al.Ultramicroscopy|June 14, 2011
A holographic biprism as a perfect energy filter?Jo Verbeeck, Giovanni Bertoni, Hannes LichteUltramicroscopy|June 14, 2011
Persistent misconceptions about incoherence in electron microscopyD Van DyckUltramicroscopy|August 26, 2011
Exploring different inelastic projection mechanisms for electron tomographyB Goris, S Bals, W Van den Broek, et al.Ultramicroscopy|August 26, 2011
Visualization of vortex core polarity in NiFe nanodots by tilted Fresnel imagesDuc-The Ngo, Stephen McVitieUltramicroscopy|August 26, 2011
Composition mapping in InGaN by scanning transmission electron microscopyAndreas Rosenauer, Thorsten Mehrtens, Knut Müller, et al.Ultramicroscopy|August 26, 2011
Dark-field electron holography for the measurement of geometric phaseM J Hÿtch, F Houdellier, F Hüe, et al.Ultramicroscopy|August 26, 2011
Broadband nanodielectric spectroscopy by means of amplitude modulation electrostatic force microscopy (AM-EFM)G A Schwartz, C Riedel, R Arinero, et al.Pageof 460