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Ultramicroscopy|August 26, 2011
Composition mapping in InGaN by scanning transmission electron microscopyAndreas Rosenauer, Thorsten Mehrtens, Knut Müller, et al.
Ultramicroscopy|August 26, 2011
Dark-field electron holography for the measurement of geometric phaseM J Hÿtch, F Houdellier, F Hüe, et al.
Ultramicroscopy|July 12, 2011
Optimized hand fabricated AFM probes for simultaneous topographical and electrochemical tapping mode imagingRaul D Rodriguez, Agnès Anne, Edmond Cambril, et al.
Ultramicroscopy|July 12, 2011
Evaluation of two-dimensional strain distribution by STEM/NBDFumihiko Uesugi, Akira Hokazono, Shiro Takeno
Ultramicroscopy|July 12, 2011
MEGACELL: a nanocrystal model construction software for HRTEM multislice simulationDaniel G Stroppa, Ricardo D Righetto, Luciano A Montoro, et al.
Ultramicroscopy|July 12, 2011
Intrinsic dissipation in atomic force microscopy cantileversFredy Zypman
Ultramicroscopy|September 21, 2011
Adaptive aberration correction using a triode hyperbolic electron mirrorJ P S Fitzgerald, R C Word, R Könenkamp
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