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Ultramicroscopy|May 2, 2001
Concentration limits for the measurement of boron by electron energy-loss spectroscopy and electron-spectroscopic imagingY Zhu, R F Egerton, M MalacUltramicroscopy|December 15, 2022
Secondary electron count imaging in SEMAkshay Agarwal, John Simonaitis, Vivek K Goyal, et al.Ultramicroscopy|January 1, 1987
A new resolution criterion based on spectral signal-to-noise ratiosM Unser, B L Trus, A C StevenUltramicroscopy|January 1, 1987
How to obtain a thickness-independent image in a STEMC Jeanguillaume, M TencéUltramicroscopy|January 1, 2026
A correlation-based optimization model to recover lost and distorted data from scanning tunneling microscopy images based on density functional theoryEhsan Moradpur-Tari, Andreas Kyritsakis, Mohadeseh Karimkhah, et al.Ultramicroscopy|January 1, 1980
Radiation damage of phosphatidylcholine bilayers effects of temperature and hydrationS W HuiUltramicroscopy|November 1, 1993
Low-dose thickness measurement of glucose-embedded protein crystals by electron energy loss spectroscopy and STEM dark-field imagingR D Leapman, J Brink, W ChiuUltramicroscopy|March 1, 1993
Cryo-crinkling: what happens to carbon films on copper grids at low temperatureF P Booy, J B PawleyUltramicroscopy|February 1, 1993
Flopping polypeptide chains and Suleika's subtle imperfections: analysis of variations in the electron micrograph of a purple membrane crystalJ Frank, W Chiu, R HendersonUltramicroscopy|January 1, 1980
Imaging unstained proteoglycan aggregates by soft x-ray contact microscopyB J Panessa, J B Warren, P Hoffman, et al.Pageof 458