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Ultramicroscopy|February 24, 2001
Implementation of self-sensing SPM cantilevers for nano-force measurement in microroboticsS Fahlbusch, S FatikowUltramicroscopy|February 24, 2001
Fabrication of quantum well microcantilever photon detectorsP G Datskos, S Rajic, L R Senesac, et al.Ultramicroscopy|February 24, 2001
Modeling of cylindrically tapered cantilevers for transverse dynamic force microscopy (TDFM)M Antognozzi, D R Binger, A D Humphris, et al.Ultramicroscopy|February 24, 2001
STM studies of 1-D noble metal growth on siliconA A Baski, K M Jones, K M SaoudUltramicroscopy|February 24, 2001
A model for the hillock formation on graphite surfaces by 246 MeV Kr+ ionsP Nagy, B Szabó, Z S Szabó, et al.Ultramicroscopy|February 24, 2001
Study of microcontact printed patterns by chemical force microscopyM Fujihira, M Furugori, U Akiba, et al.Ultramicroscopy|May 2, 2001
A simple model of holography and some enhanced resolution methods in electron microscopyJ M RodenburgUltramicroscopy|May 2, 2001
Concentration limits for the measurement of boron by electron energy-loss spectroscopy and electron-spectroscopic imagingY Zhu, R F Egerton, M MalacUltramicroscopy|December 15, 2022
Secondary electron count imaging in SEMAkshay Agarwal, John Simonaitis, Vivek K Goyal, et al.Ultramicroscopy|January 1, 1987
A new resolution criterion based on spectral signal-to-noise ratiosM Unser, B L Trus, A C StevenPageof 460