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Ultramicroscopy|November 26, 2008
Determining the composition of small features in atom probe: bcc Cu-rich precipitates in an Fe-rich matrixA Morley, G Sha, S Hirosawa, et al.Ultramicroscopy|August 12, 2009
What atomic resolution annular dark field imaging can tell us about gold nanoparticles on TiO(2) (110)S D Findlay, N Shibata, Y IkuharaUltramicroscopy|June 16, 2009
A versatile soft X-ray transmission system for time resolved in situ microscopy with chemical contrastJ Forsberg, C-J Englund, L-C DudaUltramicroscopy|December 1, 1976
A method for producing hollow cone illumination electronically in the conventional transmission microscopeW Krakow, L A HowlandUltramicroscopy|May 12, 2009
Morphological investigations of cells that adhered to the irregular patterned polydimethylsiloxane (PDMS) surface without reagentsSung Hee Chung, Junhong MinUltramicroscopy|August 4, 2009
Enhanced imaging in low dose electron microscopy using electron countingG McMullan, A T Clark, R Turchetta, et al.Ultramicroscopy|August 4, 2009
Automated monitoring to reduce electron microscope downtimeMatthias J Brunner, Guenter P ReschUltramicroscopy|September 25, 2009
Dopant distributions in n-MOSFET structure observed by atom probe tomographyK Inoue, F Yano, A Nishida, et al.Ultramicroscopy|July 7, 2009
Charge compensation by in-situ heating for insulating ceramics in scanning electron microscopeLi Wang, Yuan Ji, Bin Wei, et al.Ultramicroscopy|July 7, 2009
Initial experimental results on a magnetic beam separator spectrometer for the SEMMans Osterberg, Hung Quang Hoang, Anjam KhursheedPageof 460