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Ultramicroscopy|June 23, 2020
Quantitative electric field mapping of a p-n junction by DPC STEMSatoko Toyama, Takehito Seki, Satoshi Anada, et al.Ultramicroscopy|May 4, 2020
Metrology of crystal defects through intensity variations in secondary electrons from the diffraction of primary electrons in a scanning electron microscopeG Naresh-Kumar, A Alasmari, G Kusch, et al.Ultramicroscopy|November 1, 1989
The application of the maximum entropy method to electron microscopic tomographyM C Lawrence, M A Jaffer, B T SewellUltramicroscopy|June 9, 2015
Characterisation of interfacial segregation to Cu-enriched precipitates in two thermally aged reactor pressure vessel steel weldsP D Styman, J M Hyde, K Wilford, et al.Ultramicroscopy|June 30, 2015
Methodology exploration of specimen preparation for atom probe tomography from nanowiresJiangtao Qu, Derek Wong, Sichao Du, et al.Ultramicroscopy|July 5, 2015
Theoretical study of precision and accuracy of strain analysis by nano-beam electron diffractionChristoph Mahr, Knut Müller-Caspary, Tim Grieb, et al.Ultramicroscopy|July 20, 2015
Effective beam separation schemes for the measurement of the electric Aharonov-Bohm effect in an ion interferometerG Schütz, A Rembold, A Pooch, et al.Ultramicroscopy|July 24, 2015
In situ visualisation of electromigration in Pt nanobridges at elevated temperaturesTatiana Kozlova, Henny W ZandbergenUltramicroscopy|July 20, 2016
Nanoscale probing of bandgap states on oxide particles using electron energy-loss spectroscopyQianlang Liu, Katia March, Peter A CrozierUltramicroscopy|July 26, 2016
Assessing electron beam sensitivity for SrTiO3 and La0.7Sr0.3MnO3 using electron energy loss spectroscopyMagnus Nord, Per Erik Vullum, Ingrid Hallsteinsen, et al.Pageof 460