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Ultramicroscopy|July 24, 2015
In situ visualisation of electromigration in Pt nanobridges at elevated temperaturesTatiana Kozlova, Henny W ZandbergenUltramicroscopy|July 20, 2016
Nanoscale probing of bandgap states on oxide particles using electron energy-loss spectroscopyQianlang Liu, Katia March, Peter A CrozierUltramicroscopy|July 26, 2016
Assessing electron beam sensitivity for SrTiO3 and La0.7Sr0.3MnO3 using electron energy loss spectroscopyMagnus Nord, Per Erik Vullum, Ingrid Hallsteinsen, et al.Ultramicroscopy|April 12, 2020
Low energy nano diffraction (LEND) - A versatile diffraction technique in SEMPeter Schweizer, Peter Denninger, Christian Dolle, et al.Ultramicroscopy|August 16, 2016
In situ TEM Raman spectroscopy and laser-based materials modificationF I Allen, E Kim, N C Andresen, et al.Ultramicroscopy|August 17, 2016
In situ electron holography of electric potentials inside a solid-state electrolyte: Effect of electric-field leakageYuka Aizawa, Kazuo Yamamoto, Takeshi Sato, et al.Ultramicroscopy|June 17, 2020
Coherent x-ray scattering in an XPEEM setupT O Menteş, F Genuzio, V Schánilec, et al.Ultramicroscopy|August 17, 2016
Sparse modeling of EELS and EDX spectral imaging data by nonnegative matrix factorizationMotoki Shiga, Kazuyoshi Tatsumi, Shunsuke Muto, et al.Ultramicroscopy|January 1, 1984
Methods for specimen thickness determination in electron microscopyJ Berriman, R K Bryan, R Freeman, et al.Ultramicroscopy|January 1, 1984
An HVEM for high resolution low-dose studies of biomacromoleculesJ PawleyPageof 458