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Ultramicroscopy|April 12, 2020
Low energy nano diffraction (LEND) - A versatile diffraction technique in SEMPeter Schweizer, Peter Denninger, Christian Dolle, et al.Ultramicroscopy|August 16, 2016
In situ TEM Raman spectroscopy and laser-based materials modificationF I Allen, E Kim, N C Andresen, et al.Ultramicroscopy|August 17, 2016
In situ electron holography of electric potentials inside a solid-state electrolyte: Effect of electric-field leakageYuka Aizawa, Kazuo Yamamoto, Takeshi Sato, et al.Ultramicroscopy|June 17, 2020
Coherent x-ray scattering in an XPEEM setupT O Menteş, F Genuzio, V Schánilec, et al.Ultramicroscopy|August 17, 2016
Sparse modeling of EELS and EDX spectral imaging data by nonnegative matrix factorizationMotoki Shiga, Kazuyoshi Tatsumi, Shunsuke Muto, et al.Ultramicroscopy|January 1, 1984
Methods for specimen thickness determination in electron microscopyJ Berriman, R K Bryan, R Freeman, et al.Ultramicroscopy|January 1, 1984
An HVEM for high resolution low-dose studies of biomacromoleculesJ PawleyUltramicroscopy|January 1, 1984
Towards an alignment of the actin molecule within the actin filamentP R Smith, W E Fowler, U AebiUltramicroscopy|January 1, 1984
Specimen preparative methods for electron crystallography of soluble proteinsH A Cohen, T W Jeng, R A Grant, et al.Ultramicroscopy|January 1, 1978
An integrated set of computer programs for processing electron micrographs of biological structuresP R SmithPageof 460