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Ultramicroscopy|April 20, 2004
A further discussion on the peculiarity of maximum entropy image deconvolution in HREMH B Wang, Y M Wang, F H LiUltramicroscopy|March 22, 2005
Conventional and back-side focused ion beam milling for off-axis electron holography of electrostatic potentials in transistorsRafal E Dunin-Borkowski, Simon B Newcomb, Takeshi Kasama, et al.Ultramicroscopy|June 2, 2005
Focused ion beam-nanomachined probes for improved electric force microscopyClaudia Menozzi, Gian Carlo Gazzadi, Andrea Alessandrini, et al.Ultramicroscopy|May 18, 2005
3D spectrum imaging of multi-wall carbon nanotube coupled pi-surface modes utilising electron energy-loss spectra acquired using a STEM/Enfina systemA Seepujak, U Bangert, A Gutiérrez-Sosa, et al.Ultramicroscopy|June 7, 2005
ACE: automated CTF estimationSatya P Mallick, Bridget Carragher, Clinton S Potter, et al.Ultramicroscopy|June 7, 2005
Electrically conductive and optically transparent Sb-doped SnO2 STM-probe for local excitation of electroluminescenceVolker Jacobsen, Tanel Tätte, Robert Branscheid, et al.Ultramicroscopy|June 18, 2005
Quantification of biopolymer filament structureSamir A Shah, Pete Santago, Bruce K RubinUltramicroscopy|May 12, 2005
IMAGE-WARP: a real-space restoration method for high-resolution STEM images using quantitative HRTEM analysisAleksander Recnik, Günter Möbus, Saso SturmUltramicroscopy|May 12, 2005
Scripting-customized microscopy tools for Digital MicrographD R G Mitchell, B SchafferUltramicroscopy|May 12, 2005
Visualization of single-wall carbon nanotube (SWNT) networks in conductive polystyrene nanocomposites by charge contrast imagingJoachim Loos, Alexander Alexeev, Nadia Grossiord, et al.Pageof 460