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Ultramicroscopy

Showing results (131-140 of 4,741) with videos related to

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Ultramicroscopy|May 20, 2004
The tuning of a Zernike phase plate with defocus and variable spherical aberration and its use in HRTEM imagingM Lentzen
Ultramicroscopy|May 20, 2004
Shear force distance control in a scanning near-field optical microscope: in resonance excitation of the fiber probe versus out of resonance excitationD A Lapshin, V S Letokhov, G T Shubeita, et al.
Ultramicroscopy|April 20, 2004
Imaging and thickness measurement of amorphous intergranular films using TEMI MacLaren
Ultramicroscopy|April 20, 2004
A further discussion on the peculiarity of maximum entropy image deconvolution in HREMH B Wang, Y M Wang, F H Li
Ultramicroscopy|March 22, 2005
Conventional and back-side focused ion beam milling for off-axis electron holography of electrostatic potentials in transistorsRafal E Dunin-Borkowski, Simon B Newcomb, Takeshi Kasama, et al.
Ultramicroscopy|June 2, 2005
Focused ion beam-nanomachined probes for improved electric force microscopyClaudia Menozzi, Gian Carlo Gazzadi, Andrea Alessandrini, et al.
Ultramicroscopy|May 18, 2005
3D spectrum imaging of multi-wall carbon nanotube coupled pi-surface modes utilising electron energy-loss spectra acquired using a STEM/Enfina systemA Seepujak, U Bangert, A Gutiérrez-Sosa, et al.
Ultramicroscopy|June 7, 2005
ACE: automated CTF estimationSatya P Mallick, Bridget Carragher, Clinton S Potter, et al.
Ultramicroscopy|June 7, 2005
Electrically conductive and optically transparent Sb-doped SnO2 STM-probe for local excitation of electroluminescenceVolker Jacobsen, Tanel Tätte, Robert Branscheid, et al.
Ultramicroscopy|June 18, 2005
Quantification of biopolymer filament structureSamir A Shah, Pete Santago, Bruce K Rubin
Pageof 475

Showing results (131-140 of 4,741) with videos related to

Sort By:
Pageof 475
Ultramicroscopy|May 20, 2004
The tuning of a Zernike phase plate with defocus and variable spherical aberration and its use in HRTEM imagingM Lentzen
Ultramicroscopy|May 20, 2004
Shear force distance control in a scanning near-field optical microscope: in resonance excitation of the fiber probe versus out of resonance excitationD A Lapshin, V S Letokhov, G T Shubeita, et al.
Ultramicroscopy|April 20, 2004
Imaging and thickness measurement of amorphous intergranular films using TEMI MacLaren
Ultramicroscopy|April 20, 2004
A further discussion on the peculiarity of maximum entropy image deconvolution in HREMH B Wang, Y M Wang, F H Li
Ultramicroscopy|March 22, 2005
Conventional and back-side focused ion beam milling for off-axis electron holography of electrostatic potentials in transistorsRafal E Dunin-Borkowski, Simon B Newcomb, Takeshi Kasama, et al.
Ultramicroscopy|June 2, 2005
Focused ion beam-nanomachined probes for improved electric force microscopyClaudia Menozzi, Gian Carlo Gazzadi, Andrea Alessandrini, et al.
Ultramicroscopy|May 18, 2005
3D spectrum imaging of multi-wall carbon nanotube coupled pi-surface modes utilising electron energy-loss spectra acquired using a STEM/Enfina systemA Seepujak, U Bangert, A Gutiérrez-Sosa, et al.
Ultramicroscopy|June 7, 2005
ACE: automated CTF estimationSatya P Mallick, Bridget Carragher, Clinton S Potter, et al.
Ultramicroscopy|June 7, 2005
Electrically conductive and optically transparent Sb-doped SnO2 STM-probe for local excitation of electroluminescenceVolker Jacobsen, Tanel Tätte, Robert Branscheid, et al.
Ultramicroscopy|June 18, 2005
Quantification of biopolymer filament structureSamir A Shah, Pete Santago, Bruce K Rubin
Pageof 475