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Ultramicroscopy|December 20, 2021
Spectrum imaging measurements with semi-parallel detection using an AES apparatusNoboru Taguchi, Tatsuya Uchida, Konomi Ikita, et al.Ultramicroscopy|December 23, 2021
Effect of electron beam irradiation on the temperature of single AuGe nanoparticles in a TEMAleksandr Kryshtal, Mikolaj Mielczarek, Jakub PawlakUltramicroscopy|July 21, 2019
Imaging properties of hemispherical electrostatic energy analyzers for high resolution momentum microscopyChristian Tusche, Ying-Jiun Chen, Claus M Schneider, et al.Ultramicroscopy|August 5, 2019
An inelastic multislice simulation method incorporating plasmon energy lossesB G MendisUltramicroscopy|March 30, 2019
Fourier optics of image formation in aberration-corrected LEEMK M Yu, K L W Lau, M S AltmanUltramicroscopy|March 30, 2019
Tip wear and tip breakage in high-speed atomic force microscopesTimo Strahlendorff, Gaoliang Dai, Detlef Bergmann, et al.Ultramicroscopy|March 11, 2014
In situ determination of misorientation angle of grain boundary by field ion microscopy analysisJun Takahashi, Kazuto Kawakami, Yukiko KobayashiUltramicroscopy|June 10, 2008
Automatic bias-reduction controller for a scanning tunneling microscopeEli FlaxerUltramicroscopy|June 13, 2008
Characterization of the tip-loading force-dependent tunneling behavior in alkanethiol metal-molecule-metal junctions by conducting atomic force microscopyHyunwook Song, Hyoyoung Lee, Takhee LeeUltramicroscopy|June 13, 2008
Influence of Poisson's ratio variation on lateral spring constant of atomic force microscopy cantileversMeng-Kao Yeh, Nyan-Hwa Tai, Bo-Yi ChenPageof 460