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Ultramicroscopy|February 8, 2005
The spatial resolution of imaging using core-loss spectroscopy in the scanning transmission electron microscopeE C Cosgriff, M P Oxley, L J Allen, et al.Ultramicroscopy|May 19, 2005
Comments on "Observation of the surface stress induced in microcantilevers by electrochemical redox processes" by F. Tian, J.H. Pei, D.L. Hedden, G.M. Brown, T. ThundatG G Láng, T A Rokob, G HorányiUltramicroscopy|September 29, 2004
Role of multipole moment of the probe in apertureless near-field optical microscopyS V SukhovUltramicroscopy|September 29, 2004
Coherent inelastic scattering in Si and TiAlAlexander F Moodie, Tobias A Colson, Harold J WhitfieldUltramicroscopy|September 29, 2004
Off-axis electron holography without Fresnel fringesKazuo Yamamoto, Tsukasa Hirayama, Takayoshi TanjiUltramicroscopy|March 19, 2005
Error tolerance of an iterative phase retrieval algorithm for moveable illumination microscopyH M L Faulkner, J M RodenburgUltramicroscopy|May 7, 2005
Multislice theory of fast electron scattering incorporating atomic inner-shell ionizationC DwyerUltramicroscopy|May 12, 2005
Use of surface affinity enrichment and cryo-embedding to prepare in vitro reconstituted mitotic chromosomes for EM tomographyPeter König, Michael Braunfeld, David A AgardUltramicroscopy|May 12, 2005
Valence electron energy-loss spectroscopy in monochromated scanning transmission electron microscopyRolf Erni, Nigel D BrowningPageof 460