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Ultramicroscopy|November 24, 2004
Location specific in situ TEM straining specimens made using FIBR D Field, P A Papin
Ultramicroscopy|November 24, 2004
Influence of the atomic force microscope tip on the multifractal analysis of rough surfacesPetr Klapetek, Ivan Ohlídal, Jindrich Bílek
Ultramicroscopy|February 8, 2005
Adhesion mode atomic force microscopy study of dual component protein filmsAashiish Agnihotri, Christopher A Siedlecki
Ultramicroscopy|March 11, 2008
Characterization of JEOL 2100F Lorentz-TEM for low-magnification electron holography and magnetic imagingM A Schofield, M Beleggia, Y Zhu, et al.
Ultramicroscopy|January 31, 2006
Obtaining TEM images with a uniform deviation parameterAlwyn Eades
Ultramicroscopy|January 3, 2006
Atomic force microscopy tips (cantilevers) as molecular nucleic acid sensorsCengiz Koçum, S Doğutan Ulgen, Emrecan Cubukçu, et al.
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